JEOL USA Press Releases

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...

11 JUNE 2019, PEABODY, MA: JEOL USA has announced the addition of two new products to its nuclear magnetic resonance (NMR) portfolio. The  2mm Magic Angle Spinning (MAS) NMR Probe for Solids and Pre-Heat Auto-Sample Changer (ASC) expand JEOL’s extensive offering of advanced NMR solutions for polymer research, materials science and biosolids. The 2mm MAS NMR Probe is well suited for both materials and biosolids NMR. The 2mm MAS Probe is the ideal compromise in ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA has expanded its mass spectrometer product line with the development of a new GC-triple quadrupole mass spectrometer system introduced at the Pittcon Conference in Philadelphia this week in booth #3035. The new JMS-TQ4000GC answers the need for an ultrahigh-speed triple-quadrupole mass spectrometer that accurately measures trace or residual pesticides in agricultural materials, trace levels of regulated chemicals in tap water, and simplifies quantitative analysis of ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA JEOL USA has established an OEM agreement with SpectralWorks, Ltd. (UK) to distribute AnalyzerPro® software for use with JEOL’s mass spectrometer systems.  AnalyzerPro®’s functions for chromatographic deconvolution, target compound identification, sample-to-sample comparison and chemometric analysis provide powerful tools for examining the data from JEOL’s mass spectrometers, in particular the JEOL AccuTOF-GCx-plus high-resolution time-of-flight GC/MS system.  Example applications of AnalyzerPro® with the AccuTOF-GCX-plus include analysis of coffees ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL has developed a new software package, msFineAnalysis, to enhance qualitative analysis of compounds using high-resolution GC-mass spectrometry. The new software takes qualitative GC-MS analysis to a whole new level with the JEOL AccuTOF-GCx PLUS mass spectrometer. msFineAnalysis integrates the information from multiple ionization techniques with database search, exact mass, and isotope data. The report compares the spectral matches from a NIST or NIST-formatted mass spectral ...

PEABODY, MA:17 January 2019: JEOL USA has developed new methodology using the company’s ROYAL HFX Probe to offer a powerful and practical alternative for the elucidation of crucial structural information. It has particular merit in the analysis of complex pharmaceutical mixtures that contain a drug substance plus its various metabolites.  It’s a familiar challenge for pharmaceutical development scientists and now, rather than relying on chromatography to separate a mixture ahead of the analysis of selected ...

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018.

Whenever there’s a forensic investigation that requires a closer look with a high-powered electron microscope, chances are the microscope is from JEOL. After being made aware of some of the high profile cases investigated by Microtrace LLC in Illinois using the JEOL Field Emission Scanning Electron Microscope, JEOL spoke with the lab’s forensic scientist. At Microtrace, the company’s father-son team of Skip and Chris Palenik have achieved a kind of celebrity status. But more ...

(November 8, 2018, Peabody, Mass.) --  JEOL has achieved a major expansion in the quantitative and statistical analysis capability of its Nuclear Magnetic Resonance Spectrometers (NMR) through collaboration with the developer of the revolutionary CRAFT (Complete Reduction to Amplitude-Frequency Table) data processing technique.   In conjunction with the recent JEOL DELTA NMR software release 5.3.0, CRAFT for DELTA V1.0 provides direct time domain-to-spreadsheet analysis, allowing for more objective extraction of quantitative information for compounds of interest, ...