JEOL USA Press Releases

The 3D structure of a biomolecule, such as a protein is becoming an essential information for research and development of biochemistry and drug discovery. While the analysis method using cryo-EM is widespread, a tool to dramatically improve the speed of analysis work, "EG-grid™" was developed by Prof. Inoue. We interviewed Prof. Inoue about its characteristics. Rapid Penetration of cryo-EM As a method for 3D structural analysis of proteins, cryo-electron microscopy (cryo-EM) has rapidly spread. In the ...

JASON Features: Expanded functionality for 3D spectra and beyond Additional statistical parameters in the Fit dialog New plugin: AffinityScreen for 1D fragment-based ligand screening Further improvements for NMR assignment Independent dark/light mode settings for JASON Accelerated qNMR analysis with SMILEQ See how JASON version 5.3 can help you: Analysis and statistical tools: Additional statistical parameters in the Fit dialog. The results of fitting now include the correlation coefficient R2 and root mean standard error (RMSE) of the fit. We’ve added to our peak fitting ...

JEOL Ltd. would like to extend its heartfelt congratulations to Professor Kitagawa, executive vice-president and distinguished professor at the Kyoto University, on his receiving the 2025 Nobel Prize in chemistry for the “development of Metal-Organic Frameworks (MOFs)”. We also wish to express our admiration for his remarkable achievements and dedication over many years. Professor Kitagawa was the first in the world to successfully synthesize and establish the concept of PCP (Porous Coordination Polymer)/MOF (Metal-Organic Framework). PCP/MOF is ...

Yoshinori Yanagisawa and Yusuke Nishiyama from JEOL Ltd. have been named among the Stanford-Elsevier list of the world's top 2% of scientists in 2025 in the category of "single recent year impact". Additionally, Robert B. Cody from JEOL USA, Inc. has been selected for both the "single recent year impact" and "career-long impact" categories. For JEOL Ltd., this marks Nishiyama’s eighth consecutive appearance on the list since its inception. Below is a comment from Yanagisawa, ...

Program recognizes outstanding IU student research performed on the JEM-NeoARM200CF; multi-year initiative continuing through 2027 Peabody, MA – JEOL USA, Inc announced the winners of the 2025 JEOL–IU NeoARM Research Award, a program recognizing compelling undergraduate and graduate research conducted using the JEOL JEM-NeoARM200CF electron microscope. First Place: Baixu Zhu Superstructural phase transitions in polymer-grafted nanooctahedra - https://www.science.org/doi/10.1126/sciadv.adw2740 Second Place: Megan Knobeloch Visible light absorbing intergrowths with SrBi3O4Cl3 and Bi2GdO4Cl as building blocks for water splitting Third Place: Rukshanthan Selvaraj Effect of ...

January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user ...

JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).  This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the ...

JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen. This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology. Recently highlighted in a ...

The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”). This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM ...

The JSM-IT810 series Ultrahigh Resolution FE SEM made its debut at the Microscopy and Microanalysis 2024 conference in late July. This debut included live demonstrations for those in the market for an analytical ultrahigh resolution FE SEM. This new platform is where versatility meets high spatial resolution and ease-of-use with the next level in JEOL’s intelligent technology for imaging and analysis at the nanoscale. Powerful software with automation built-in, enables seamless acquisition of data from ...