JEOL USA Press Releases

JEOL USA Announces Expansion of Board of Directors and Leadership Appointments

JEOL USA Announces Expansion of Board of Directors and Leadership Appointments
July 16, 2026 — Peabody, Mass. — JEOL USA, Inc. has expanded its Board of Directors with the appointment of two members of its leadership team, Donna Gosselin and Steve Tryon. In addition, Dr. Thomas Isabell was appointed President of JEOL USA. Together, they bring decades of leadership experience spanning product management, applications, and field service, further strengthening the company's governance and strategic direction. Dr. Thomas Isabell has been a member of the JEOL management ...
Ultra-fast analysis of protein 3D structures ― sample preparation for cryo-EM in 10 minutes

Ultra-fast analysis of protein 3D structures ― sample preparation for cryo-EM in 10 minutes
The 3D structure of a biomolecule, such as a protein is becoming an essential information for research and development of biochemistry and drug discovery. While the analysis method using cryo-EM is widespread, a tool to dramatically improve the speed of analysis work, "EG-grid™" was developed by Prof. Inoue. We interviewed Prof. Inoue about its characteristics. Rapid Penetration of cryo-EM As a method for 3D structural analysis of proteins, cryo-electron microscopy (cryo-EM) has rapidly spread. In the ...
New version: JASON 5.3

New version: JASON 5.3
JASON Features: Expanded functionality for 3D spectra and beyond Additional statistical parameters in the Fit dialog New plugin: AffinityScreen for 1D fragment-based ligand screening Further improvements for NMR assignment Independent dark/light mode settings for JASON Accelerated qNMR analysis with SMILEQ See how JASON version 5.3 can help you: Analysis and statistical tools: Additional statistical parameters in the Fit dialog. The results of fitting now include the correlation coefficient R2 and root mean standard error (RMSE) of the fit. We’ve added to our peak fitting ...
nobel Susumu Kitagawa.jpg

In Commemoration of Professor Susumu Kitagawa of Kyoto University's Nobel Prize in Chemistry
JEOL Ltd. would like to extend its heartfelt congratulations to Professor Kitagawa, executive vice-president and distinguished professor at the Kyoto University, on his receiving the 2025 Nobel Prize in chemistry for the “development of Metal-Organic Frameworks (MOFs)”. We also wish to express our admiration for his remarkable achievements and dedication over many years. Professor Kitagawa was the first in the world to successfully synthesize and establish the concept of PCP (Porous Coordination Polymer)/MOF (Metal-Organic Framework). PCP/MOF is ...
JEOL employees ranked in the top 2% of the world's scientists in 2025

JEOL employees ranked in the top 2% of the world's scientists in 2025
Yoshinori Yanagisawa and Yusuke Nishiyama from JEOL Ltd. have been named among the Stanford-Elsevier list of the world's top 2% of scientists in 2025 in the category of "single recent year impact". Additionally, Robert B. Cody from JEOL USA, Inc. has been selected for both the "single recent year impact" and "career-long impact" categories. For JEOL Ltd., this marks Nishiyama’s eighth consecutive appearance on the list since its inception. Below is a comment from Yanagisawa, ...
IU NeoARM Research Award Winners 2025

JEOL USA Announces Winners of the 2025 Indiana University NeoARM Research Award
Program recognizes outstanding IU student research performed on the JEM-NeoARM200CF; multi-year initiative continuing through 2027 Peabody, MA – JEOL USA, Inc announced the winners of the 2025 JEOL–IU NeoARM Research Award, a program recognizing compelling undergraduate and graduate research conducted using the JEOL JEM-NeoARM200CF electron microscope. First Place: Baixu Zhu Superstructural phase transitions in polymer-grafted nanooctahedra - https://www.science.org/doi/10.1126/sciadv.adw2740 Second Place: Megan Knobeloch Visible light absorbing intergrowths with SrBi3O4Cl3 and Bi2GdO4Cl as building blocks for water splitting Third Place: Rukshanthan Selvaraj Effect of ...
JEOL USA Introduces New Broad Ion Beam Milling, Cross Section Polisher™

JEOL USA Introduces New Broad Ion Beam Milling, Cross Section Polisher™
January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user ...
The JEOL MARS Enables New Research in Electromagnetic Field Imaging Published in Nature Reviews Electrical Engineering

The JEOL MARS Enables New Research in Electromagnetic Field Imaging Published in Nature Reviews Electrical Engineering
JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).  This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the ...
JEM-Z200MF

Introducing the JEM-Z200MF: A Revolutionary Magnetic Field-Free Atomic Resolution Imaging System
JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen. This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology. Recently highlighted in a ...
Exploring the Range of Electron Microscopes: Resolution, Size and Users

Exploring the Range of Electron Microscopes: Resolution, Size and Users, Upcoming Webinar Hosted by Xtalks
The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”). This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM ...
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