JEOL USA Press Releases

Indiana University Selects JEOL 300kV TEM for Virus and Nanotechnology Studies

April 10, 2007, Peabody, Mass. -- The acquisition of a new 300 kV field emission Transmission Electron Microscope (TEM) from JEOL distinguishes Indiana University, Bloomington, Indiana as a major United States research facility where scientists can examine both biological and materials science structures at nanoscale resolution. Acquisition of the new JEOL TEM was completed in February 2007 with an NSF Major Research Instrumentation Grant awarded in parallel with a $1M investment made by the ...

JEOL Technics Ships 10,000th Unit

March 28th, 2007, Peabody, Mass. -- JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Technics, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). Since JEOL, Ltd. was founded in 1949, more than 6,000 JEOL instruments have been installed in the United States, and more than 51,000 worldwide. JEOL USA opened in 1962 as a wholly-owned ...

JEOL USA Hosts New England Society for Microscopy Spring Meeting

March 19, 2007, Peabody, Mass. — JEOL USA hosted the spring meeting of the New England Society for Microscopy (NESM) at its Peabody, Massachusetts headquarters on Thursday, March 15. NESM, celebrating its 40th anniversary this year, is a local affiliate of the Microscopy Society of America (MSA). The organization held its first inaugural meeting in 1967 at JEOL USA. NESM is dedicated to the promotion and advancement of the science and practice of all microscopical imaging, ...

New JEOL FE Analytical SEM for HV and LV Operation

March 12, 2007, Peabody, MA — A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples. The JSM-7001F features a unique in lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization ...

New Failure Analysis Tool from JEOL

February 13, 2007, Peabody, MA – The high spatial resolution and flexibility of the JEOL Beam Tracer allows this new failure analysis tool to precisely locate and mark defect sites in multi-layer semiconductor devices. The Beam Tracer images marginal and failed interconnects and junctions through several complex layers. It allows measurement of individual transistors, performs electrical characterization, and includes a patented Voltage Distribution Contrast method for devices produced under the 65nm design rule. A precision ...

JEOL USA Exhibiting Imaging Solutions at APEX 2007

January 16, 2007, Peabody, MA -- For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA). JEOL USA will showcase an argon ion beam cross section polisher (CP) for specimen preparation prior to high magnification imaging with the scanning electron microscope (SEM). The JEOL CP produces precise cross sections of both soft and hard materials, as well as composites. ...

JEOL DART™ Mass Spectrometer Ion Source Awarded Second Patent

November 28, 2006 (Peabody, Mass.) -- JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. This is the second U.S. patent covering the DART device and technology. The first patent was awarded in September 2005. The award-winning DART was commercially introduced ...

New JEOL 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications

November 9, 2006 (Peabody, Mass.) -- JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM). This versatile instrument, the model JEM-1400, is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images. The TEM can be quickly configured for either high contrast imaging or scanning transmission electron ...

Georgia Tech First U.S. Installation for New JEOL TEM

November 9, 2006 (Peabody, Mass.) -- JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be in operation at Georgia Tech’s School of Biology in the Cherry Emerson Building until it can be moved to the ...

High Throughput Screening of Counterfeit Drugs Described in New Paper on Novel Mass Spectrometry Techniques

August 9, 2006, Peabody, Mass. -- A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for rapid screening and analysis of counterfeit drugs. In order to chemically fingerprint counterfeit anti-malarial drugs, Prof. Facundo Fernandez’ bioanalytical chemistry lab at Georgia Tech conducts experiments using novel mass spectrometry techniques. A newly-published paper, authored by Fernandez, et al., describes the use of ambient mass spectrometry ion sources for open air, high ...
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