JEOL USA Press Releases

January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user ...

JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).  This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the ...