JEOL USA Press Releases

JEOL USA Press Releases


JEOL USA Press Releases

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research.

Real-time gas analysis with InfiTOF
JEOL will debut the InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the size of a personal computer tower. | more...

New Photoionization (PI) source for hydrocarbon analysis
A new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. Photoionization is a soft ionization method that provides molecular weight information with minimal fragmentation. It very sensitive for certain environmentally-important compound classes such as polycyclic aromatic hydrocarbons (PAHs). | more...

AccuTOFTM-DART® with ionRocket
The AccuTOF-DART will be demonstrated with a new ionRocket thermal desorption and pyrolysis system (Biochromato, Inc.). The AccuTOF-DART is virtually an “ambient ionization toolbox” that can carry out a range of techniques without having to change any hardware or remove the DART ion source. The AccuTOF-DART produces clean, reproducible, easy-to-interpret data. JEOL introduced the revolutionary DART® ion source at Pittcon 2005, and received the Pittcon Editors Gold Award. | more...

Analytical SEM for the benchtop
Nikon will be in the JEOL booth to demonstrate the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers high sensitivity backscatter electron detection with a JEOL BSE detector to detect contrast between areas of the sample with different chemical compositions. | more...

Versatile SEM with Multiple Analytical Techniques
JEOL will demonstrate its high resolution analytical Scanning Electron Microscope, the JSM-IT300LV Scanning Electron Microscope. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. This high throughput SEM features a large sample chamber for non-destructive imaging and analysis and intuitive touch screen operation. | more...

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