Artifact-free Cross-sections October 20, 2020 Operation of CP, Sample Preparation 0 The Cross Section Polisher (CP) is a new cross-section sample preparation device that addresses some of the issues involved with preparing very small and relatively soft specimens for SEM analysis. The CP can easily prepare a cross section that is hundreds of micrometers in width and can preserve nanometer-level fine structures. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. CP Article AMP-MPMD Supplement - July06.pdf 1.19 MB Showing 0 Comment Comments are closed.