Sample Preparation Equipment Documents

rss

JEOL Resources

Documentation in support of your JEOL product.

Artifact-free Cross-sections

The Cross Section Polisher (CP) is a new cross-section sample preparation device that addresses some of the issues involved with preparing very small and relatively soft specimens for SEM analysis. The CP can easily prepare a cross section that is hundreds of micrometers in width and can preserve nanometer-level fine structures.

Showing 0 Comment



Comments are closed.

Other Resources

The following resources are available concerning Sample Preparation related instruments:

  • Image Gallery
    -View a selection of Cross Section Polisher images
  • Mixed Media
    -View our series of videos on the use of the Cross Section Polisher