Artifact-free Cross-sections
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- 1 MIN READ |
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- 2435 |
- October 20, 2020 |
- Operation of CP, Sample Preparation |
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The Cross Section Polisher (CP) is a new cross-section sample preparation device that addresses some of the issues involved with preparing very small and relatively soft specimens for SEM analysis. The CP can easily prepare a cross section that is hundreds of micrometers in width and can preserve nanometer-level fine structures.