Carbon Coater (EC-32010CC) April 19, 2021 Sample Preparation 0 THIN FILM CONDUCTIVE COATING FOR SEM IMAGING JEOL’s Carbon Coater is a sample preparation device that evaporates carbon to create a conductive thin film on the sample surface. Thin film conductive coatings are effective in eliminating charging with non-conductive materials. Carbon has an advantage over heavy metal coatings (Ex. Gold or Platinum) for X-ray applications (EDS/WDS), CL or backscatter electron imaging due to its inherent low absorption characteristics. This device is simple to use with fully automated vacuum, pre-heat and evaporation sequences. Insert your samples, turn the unit on and the chamber will automatically evacuate. Press PREHEAT to degas the carbon rod, next press EVAPORATE. The unit will automatically evaporate the carbon to create the thin film. Once the carbon evaporation is completed the system automatically vents to atmosphere. Film thickness can be adjusted by changing the height of the sample stage. Basic Specifications Specification Pressure ≤ 20 Pa Carbon Electrode 1 set Evaporation Source Dedicated High Purity Carbon Rod (1mm diameter) Sample Stage 64mm (diameter) Source to Stage Distance 135mm to 165mm (adjustable) Vent time 30 seconds Evacuation System Directly-coupled rotary pump, 135L/min Evacuation Time 3 Pa in 10 minutes (no sample in chamber) Composition Number Carbon Coater 1 Rotary pump (135L/Min), includes power supply cable 1 Oil Mist Trap 1 Carbon Rod 90mm (length) x 1mm (diameter) 5 Vacuum Hose 1 Power Cable 1 Instruction Manuals for Carbon Coater and Rotary pump 1 Option Rotating and Tilting Sample Stage (EC-30030RTS) This stage is useful for samples with a significant amount of topography to aid in providing a uniform coating. Rotation Speed 50 ± 10 rpm Tilt Angle Horizontal to 90° (manual) Sample Holder 4 stub(12.5 mm diameter) 1 stub (32 mm diameter) Basic Installation Requirements Clean, dry, dust free environment. Preferred footprint: 500mm (W) x 550 mm (L) Room/Space Requirements Temperature 20 ± 5°C (59~77 °F) Humidity 60% or less Power Single Phase AC 100V, 50/60 Hz, 1.4kVA Ground Grounding Terminal (one, 100Ω or less) Main Unit 350mm (w) x 420mm (d) x 440mm (h); ~18 kg RP 170mm (w) x 487.5mm (d) x 249.5mm (h); ~27 kg For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. PN-JEOL Carbon Coater-r0918.pdf 120.15 KB Related Articles JEOL Smart Coater JEOL’s Smart Coater is simple to use with fully automated vacuum and sputtering. Insert your samples, turn the unit on and select the sputtering time. The chamber will evacuate and sputtering will begin automatically. When the unit is powered down, it vents to atmosphere. Ion beam sputter coating with CROSS SECTION POLISHER™ CROSS SECTION POLISHER™ (CP) is an SEM specimen preparation device that utilized broad Ar ion beam to produce artifact-free cross-sections. The same principle can be employed not only for ion-milling but also deposition of thin layer to the specimen surface, in particular conductive coating for followup observation of a non-conductive specimen in an SEM. Designing Better Batteries Through Innovative Microscopy Characterization Scanning Electron Microscopes (SEM) support the development of new LIB technologies with morphological observation at the micrometer to nanometer scale, as well as the chemical analysis needed to create high-performance coatings and powders. Ultra-low voltage imaging combined with signal filtering in the SEM allows direct imaging and analysis of battery constituents (anode and cathode) with nanometer resolution. Additionally, one of the important aspects of the analysis is the ability to probe chemistry of the constituents at nm scale (Fig. 1). JEOL FESEM offers the ability to perform microanalysis with energy dispersive spectroscopy (EDS) at extremely low voltages to pinpoint localized makeup of the specimens and, in particular, low atomic number materials such as carbon and fluorine. Moreover, the unique JEOL Soft X-ray spectrometer (SXES) allows researchers to analyze Li. Showing 0 Comment Comments are closed.