Sample Preparation Equipment Documents

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JEOL Resources

Documentation in support of your JEOL product.

JIB-4500 MultiBeam: High Performance SEM and Micro Milling FIB

New, easy-to-use MultiBeam system combines high resolution ion optics with the most popular SEM column in the world. The JIB-4500 MultiBeam offers increased throughput and productivity for a variety of applications, from viewing to analysis to micro milling.

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Other Resources

The following resources are available concerning Sample Preparation related instruments:

  • Image Gallery
    -View a selection of Cross Section Polisher images
  • Mixed Media
    -View our series of videos on the use of the Cross Section Polisher