Sample Preparation Equipment Documents

JEOL Resources

rss

Documentation in support of your JEOL product.

SEM Technology Advances Energy Research

High-resolution field-emission scanning electron microscopes (FEG-SEMs) have proven to be very powerful tools for energy-related research. Developments in such areas as solar thin films, oil shale, catalysis, and fuel cells require sub-nanometer resolution SEMs with a versatile set of detectors. They also require advanced sample preparation and handling techniques, such as argon ion polishing and FIB (focused ion beam). This article discusses incorporation of both advanced sample preparation and handling techniques, and the newest SEM detectors and imaging capabilities to advance energy research.

Attached Files
Showing 0 Comment


Comments are closed.

Other Resources

The following resources are available concerning Sample Preparation related instruments:

Image Gallery
  • View a selection of Cross Section Polisher images
  • Mixed Media
  • View our series of videos on the use of the Cross Section Polisher
    • JEOL USA, Inc.
      11 Dearborn Road
      Peabody, MA 01960
      © Copyright 2022 by JEOL USA, Inc.
      Terms of Use
      |
      Privacy Policy
      |
      Cookie Preferences