JEOL USA, Inc.

JEOL USA Focused Ion Beam

Applications:

Batteries

SEM, TEM, Sample Prep, and an air-isolated workflow for sensitive samples and Li detection. Analytical solutions from SXES to NMR.

Energy

Integrating sub-nanometer resolution SEM and TEM imaging and analysis for Energy Exploration

Materials Science

Obtain microstructural information and surface/bulk chemical analyses

Nanotechnology

Develop novel and significantly improved materials

Semiconductor Applications

e-Beam and ion beam optics are designed for precise patterning and inspection

Instruments:

JEOL USA offers a full Focused Ion Beam product listing for your scientific needs.

© Copyright 2024 by JEOL USA, Inc.

|

|

Cookie Preferences