JEOL USA Press Releases

March 28th, 2007, Peabody, Mass. -- JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Technics, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). Since JEOL, Ltd. was founded in 1949, more than 6,000 JEOL instruments have been installed in the United States, and more than 51,000 worldwide. JEOL USA opened in 1962 as a wholly-owned ...

March 19, 2007, Peabody, Mass. — JEOL USA hosted the spring meeting of the New England Society for Microscopy (NESM) at its Peabody, Massachusetts headquarters on Thursday, March 15. NESM, celebrating its 40th anniversary this year, is a local affiliate of the Microscopy Society of America (MSA). The organization held its first inaugural meeting in 1967 at JEOL USA. NESM is dedicated to the promotion and advancement of the science and practice of all microscopical imaging, ...

March 12, 2007, Peabody, MA — A new thermal field emission analytical SEM from JEOL, the JSM-7001F, acquires high resolution micrographs at up to 1,000,000X for applications ranging from semiconductor, metals, minerals, materials, and ceramics, to non-conductive biological samples. The JSM-7001F features a unique in lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization ...