JEOL USA Press Releases

Pollen Prevails as JEOL Names Spring Image Contest Winners

June 15, 2015, Peabody, MA -- Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row. April's winning image of hibiscus pollen grains was submitted by Dr. Howard Berg of Danforth Plant Science in St. Louis, MO, who used the JEOL JSM-6010 InTouchScope Scanning Electron Microscope (SEM) to image the sample ...
© Copyright 2024 by JEOL USA, Inc.
Terms of Use
|
Privacy Policy
|
Cookie Preferences