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Monday, April 21, 2014
JEOL Scanning Electron Microscopes
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EDS map and spectra of electrical connector
EDS map of battery cross section
JCM-6000 NeoScope Benchtop SEM

The NeoScope benchtop SEM complements both optical microscopes and traditional SEMs in the lab, and can be configured for advanced analytical applications. This compact electron microscope is as simple to operate as a digital camera, but has the powerful electron optics of an SEM, with up to 60,000X magnification. The NeoScope makes it simple for any skill level of operator to obtain outstanding SEM images in less than three minutes from sample loading to imaging.

The microscope has a sleek new design with up-to-date features. Operation is via a touch screen, and is simplified with auto focus, auto alignment, auto contrast and auto brightness controls. The NeoScope operates in both low and high vacuum modes with three settings for accelerating voltage. These parameters are suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.

This all-new NeoScope now offers integrated, full-featured Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology for advanced analytical applications.

Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope accelerates the pace of research in the life sciences, forensics, and pharmaceutical fields as well as serves as a high throughtput failure analysis tool.

Industrial & Measurement

Nikon Metrology Inc.
(810) 220-4360


Nikon Instruments Inc.

NeoScope Details
  • Three selectable accelerating voltages
  • High and low vacuum modes
  • High resolution and large depth of field 
  • 10X – 60,000X magnification without lens change
  • Sample loading to imaging in under three minutes
  • Multi-touch screen interface for intuitive operation
  • Secondary electron and backscattered electron imaging
  • Optional EDS for elemental analysis 
  • Optional tilting and rotating motor drive


Magnification 10X to 60,000X (printed as a 128mm x 96mm micrograph)
Observation Modes High vacuum and low vacuum
Accelerating Voltages 15 kV, 10 kV, and 5 kV (3-position switch)
Specimen Stage Manual control for X and Y
X: 35mm, Y: 35mm
Maximum Specimen Size

70mm diameter, 50mm thickness

Display Data Accel. Voltage, magnification, m-bar, and m-value


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