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JEM-2100 LaB6 Transmission Electron Microscope

JEM-2100 LaB6The JEM-2100 electron microscope provides solutions for a wide range of problems in the fields of materials, nanoelectronics, and biological sciences.

Based on MS Windows™ software, the JEM-2100 is intuitive and easy to use with external control functions including the optional SIRIUS™ remote control system. The advanced control system allows integration of STEM, EDS, and EELS.

The JEM-2100 features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. The optional JEOL TEMography™ software system automatically acquires and registers images, automatically calculates the 3-D reconstruction, and provides 3-D visualization software to display and rotate the image on a variety of axes. An x/y piezo stage is an available option.

The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope. A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS.

The JEM-2100 offers a number of pumping options including full dry-pumped/turbo-pumped versions for lab environments that do not allow for oil-based or rotary pumps.

JEM-2100F LaB6 Key Product Features

  Ultrahigh resolution
(UHR)
High resolution
(HR)
High tilt
(HT)
Cryo
(CR)
High contrast
(HC)
Resolution

Point
Lattice


0.194 nm
0.14 nm


0.23 nm
0.14 nm


0.25 nm
0.14 nm


0.27 nm
0.14 nm


0.31 nm
0.14 nm
Acc. Voltage
Min. step
80,100,120,160,200 kV
50 V
Stability
Acc. Voltage
OL Current

2×10–6/min
1×10–6/min
Objective Lens
Focal length
Spherical aber.
Chromatic aber.
Min. step
1.9 mm
0.5 mm
1.1 mm
1.0 nm
2.3 mm
1.0 mm
1.4 mm
1.5 nm
2.7 mm
1.4 mm
1.8 mm
1.8 nm
2.8 mm
2.0 mm
2.1 mm
2.0 nm
3.9 mm
3.3 mm
3.0 mm
5.2 nm
Spot Size
TEM mode

EDS mode
NBD mode
CBD mode
20 to 200 nm diameter 1 to 5 µm diameter
0.5 to 25 nm
diameter
alpha selector
1.0 to 25 nm
diameter
alpha selector
1.5 to 35 nm
diameter
alpha selector
2.0 to 45 nm
diameter
alpha selector
10 to 500 nm diameter
CB Diffraction
Convergent angle(2-α)
Acceptance angle
1.5 to 20 mrad or more
±10°
Magnification
Mag mode

LOW Mag mode

SA Mag mode
×2000 to 1,500,000 ×1500 to 1,200,000 ×1200 to 1,000,000 ×1000 to 800,000
×50 to 6000 ×50 to 2000
×8000 to 800,000 ×6000 to 600,000 ×5000 to 600,000 ×5000 to 400,000
Camera length
SA diff.

HD diff.
HR diff.*
80 to 2000 mm 100 to 2500 mm 100 to 2500 mm 150 to 3000 mm
4 to 80 m
333 mm
Specimen chamber

Tilting angle
Shift
±30° ±35° ±45° ±60°*** ±30°
2 mm (X,Y) 0.2 mm
(Z±0.1 mm)
2 mm (X,Y) 0.4 mm
(Z±0.2 mm)
EDS
Acceptance angle
Take-off angle

0.13 sr
25°
 
0.09 sr
20 °

*    Optional high-resolution diffraction stage required
**  When using highest-tilt specimen holder
*** Optional EDS required

note: configuration must be chosen at time of purchase.