As a global leader in scanning electron microscopy for over 50 years, we’ve just changed the rules of the game. Building off of our popular InTouchScope™ series, this SEM delivers FE SEM performance with the ease of operation you expect from our W SEMs. With its new high brightness, long life emitter, you can expect exceptional fidelity at any kV. The JSM-IT300HR provides expanded performance over traditional W SEMs at a very attractive price.
The JSM-IT300HR has a large analytical chamber equipped with several ports to accommodate multiple detectors such as: multiple EDS detectors, WDS, EBSD, CL, etc., creating a nano-lab inside your SEM. Careful design ensures optimized geometry for all detectors. Furthermore, the stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
Low vacuum capability is built in allowing for imaging and analysis of all types of samples in their native state. It can be equipped with a JEOL EDS detector for fast analysis directly from the SEM software interface.
Our InTouchScope™ series SEMs are designed to make SEM accessible to everyone. All the controls are at your fingertips with its intuitive software interface. You can operate this SEM with multi-touch gestures along with keyboard/mouse. It also includes an operation panel for those looking for a more traditional feel. Advanced automatic algorithms will produce clear images in a snap. There is even a ‘Navi’ mode with guided operation from sample introduction to automatic condition setting for new or occasional users.
Contact us and see for yourself!