JEOL is a world leader in the field of Transmission Electron Microscopy (TEM), with nearly 60 years of expertise in developing high performance, high stability TEMs for applications in both the life sciences and material sciences. Some of the world’s most notable researchers use JEOL TEMs in their work.

JEOL innovations are legion, ranging from ultrahigh resolution optics for atom-to-atom characterization, to optimizing the user experience with an ergonomic design, user-friendly software and remote operation. JEOL has partnered with many industry and academic leaders to provide outstanding applications support and technology for advancing science.

Using the JEOL TEM, biologists and pathologists can view and reconstruct 3D images of the finest cell structures. Crystallographers, metallurgists or semiconductor research scientists use high voltage/high spatial resolution TEMs to routinely image atoms. Materials researchers monitor and design materials at the nanoscale with custom-tailored properties. Often JEOL TEMs are used for multidisciplinary purposes among several research teams.

JEOL offers 100 keV to 1 MeV TEMs that can be configured with an energy filter, field emission gun, or aberration correction to support both routine analysis and leading edge research.

There is a JEOL TEM for every application, including cryotomography, STEM, MDS, and EDS. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter. The aberration corrected (Cs) TEM ensures the highest image resolution. All JEOL TEMs ensure the highest stability and the ideal resolution for a wide range of applications.

Our TEM product line is comprised of:

100 / 120 kV TEM

200 kV TEM/FEG TEM

IVEM 300 kV TEM/FEG TEM