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Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core
August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other at 200kV, will be used in Life and Soft Materials Sciences research. As such, the instruments are equipped for imaging of conventionally obtained stained samples or sections as well as frozen hydrated specimens. State-of-the-art software will allow for high throughput using techniques ranging from tomography to single particle imaging. RPAIEMC staff, members of the Wright lab, and users from the region will image and study a broad range of biological and soft materials samples such as: infectious viruses; pathogenic and nonpathogenic bacteria; mammalian tissues; self-assembled peptide matrices; and nanoprobes. Use of Phase Plate Technology Increases Imaging Contrast for Biological Structures The JEOL model JEM-2200FS TEM with its in-column energy filter and thin film/electro-static phase plate technology will be the showpiece of the expanded EM laboratory. “Phase plate technology, exclusively available commercially for TEMs through JEOL, increases biological specimen imaging contrast by a factor of 3-5, which is going to be of tremendous benefit for imaging a range of cryo-specimens from single particles all the way to sectioned materials,” said Dr. Jaap Brink, JEOL’s TEM Product Manager Emory to Serve as Unique Center for Biological Imaging “This will be the first biological Field Emission TEM in the state of Georgia and will establish Emory University as a unique center for biological imaging. The 2200FS will be dedicated to cryo-imaging of biological and soft materials specimens,” said Dr. Elizabeth R. Wright, Director of the RPAIEMC and Assistant Professor in the Department of Pediatrics, Emory University School of Medicine, and Georgia Research Alliance Distinguished Investigator. Dr. Wright is the Principal Investigator for the major research instrumentation grant awarded by the National Science Foundation (NSF: 0923395), which supported the acquisition of the 200 kV FEG-TEM. As part of the evaluation process, Dr. Wright collected data on bacterial samples using phase plates specifically designed for the JEOL TEM by Prof. Kuniaki Nagayama’s lab at the Okazaki Institute for Integrative Bioscience in Japan, the lab that developed the technology. She also collected data in the lab of Dr. Wah Chiu at the National Center for Macromolecular Imaging at Baylor College of Medicine in Texas, a center for excellence in cryo-electron microscopy. Practical Use of Phase Plate Technology for Higher Contrast TEM Imaging The practical use of phase plate technology provides a marked increase in specimen contrast not typically seen in biological samples imaged under cryo-conditions. “My lab specializes in cryo-EM and cryo-electron tomography (cryo-ET) of bacteria and viruses. We do not alter the structure of the sample through the addition of contrast enhancing stains. Therefore, the primary way we obtain greater contrast is to apply a defocus to the image. However, this is at the expense of resolution. The use of a phase plate, both the Zernike type and the electro-static type, will allow us to maximize the contrast of unstained samples without the use of a defocus and thus retain the resolution. It is an amazing benefit to have this technology to apply to structural studies of pathogens,” Wright said. Dr. Wright studies the basic structure of several pathogenic viruses and bacteria in order to develop novel vaccines and therapeutics. Her research involves examining viruses, such as HIV-1, measles, and respiratory syncytial virus (RSV), which are generally100 to 300 nm in size. Specific targets include the examination of viral assembly and maturation, as well as the viral glycoproteins that attach to and fuse viruses to the target cell. Collaborative Partnership to Advance Phase Plate Technology A collaborative partnership between Emory University and JEOL USA, aimed at maximizing the efficacy of the phase plate technology, will enhance the visibility of the RPAIEMC throughout the EM community and will enable JEOL to favorably present the latest and most sophisticated cryo-TEM in a state-of-the-art facility. Dedicated TEM for Conventional Samples A JEOL model JEM-1400 was purchased simultaneously with support from a shared instrumentation grant from the National Institutes of Health (NIH: 1S10RR025679-01), which was awarded to Prof. Paul Spearman, Nahmias-Schinazi Research Professor and Vice Chair for Research Department of Pediatrics, Emory University and Chief Research Officer, Children’s Healthcare of Atlanta. The RPAIEMC at Emory provides regional investigators with instrumentation, training, and expertise in all areas of biological and soft materials electron microscopy. The new 120 keV TEM will be used for imaging thousands of research samples and Wright says it “will be dedicated primarily to conventional EM of sectioned and negatively stained materials. It will also allow users to perform basic tomography on many sample types.”
 

JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution
Combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun
 

JEOL Correlative Microscope Wins MT-10 Award
Top honors for the JEOL ClairScope
 

JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test
New Paper Published in Epidemiology, Biomarkers, & Prevention Research
 

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM
 Imaging resolution guaranteed at 78 picometers with an energy resolution of 0.3 eV
 

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award
This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state.
 

Scanning Electron Microscope Reveals “The Scream” in Oil Shale
Who says science isn’t fun?
 

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System
Reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint
 

JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM
Multifold Increase in Biological Specimen Imaging Contrast
 

Award-winning Pioneer in Nanoscience Research Visits JEOL USA
Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima
 

UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope
UT Dallas advances its role as key contributor to the development of next-generation semiconductor devices
 

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio
Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.
 

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina
Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.
 

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance
Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.
 

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso
Will provide capabilities to establish world class facility at UTEP
 

JEOL Canada Increases Sales Support for Scientific Instrumentation
Appointments of new sales manager and customer service representative
 

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere
New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope
 

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.
 

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009
SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.
 


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