New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina
Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.
 

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance
Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.
 

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso
Will provide capabilities to establish world class facility at UTEP
 

JEOL Canada Increases Sales Support for Scientific Instrumentation
Appointments of new sales manager and customer service representative
 

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere
New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope
 

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.
 

Download SEM Theory and Operation Books from JEOL Website
Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.
 

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009
SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.
 

West Virginia University Advancing Nanoscience with New E-beam SEM
Analytical field emission SEM is part of the University’s vigorous WVNano Initiative
 

Shale and Solar Thin Film Cross Sectioning Demonstrated in New E-Brochure
Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples
 

Peter Genovese Named President of JEOL USA
Member of the JEOL sales organization for more than 25 years
 

New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University
JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory
 

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)
New benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class
 

JEOL USA and the College of Microscopy Increase Collaborative Efforts to Improve Microscopy Education
Internationally known for its state-of-the-art laboratories and work in small-particle identification and analysis, the College of Microscopy provides highly specialized training and continuing education for scientists, crime lab personnel, researchers, educators and technicians from around the world.
 

JEOL Introduces Highest Sensitivity GC-TOF Mass Spectrometer
Highest sensitivity of any GC time-of-flight mass spectrometer commercially available
 

JEOL Marks 60th Anniversary at Pittcon 2009
60th anniversary kicks off with celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences
 

JEOL Produces New Brochure on Instrumentation for Forensic Science
Includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM).