The development and subsequent application of new materials depends on a fundamental understanding of their structure and properties, and the bonding between atoms. JEOL SEMs, TEMs, Microprobes, and Auger microscopes, as well as cross sectional specimen preparation devices, mass spectrometer and NMR spectrometers are all used in the characterization of materials. Microstructural information and surface/bulk chemical analyses are readily obtained from these instruments with absolutely state-of-the-art results. Hard, soft, magnetic, frozen, and composite materials can easily be examined. Experiments involving variations in specimen temperature and ambient gas pressure, specimen straining, and changes in electrical bias or magnetic field can all be accomplished with special optional stages and feedthroughs. Solid-state NMR techniques can be used to characterize microscopic chemical structures.