New Extended Pressure SEM from JEOL
September 4, 2013 (Peabody, MA) -- JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten low vacuum SEMs. This all-new design builds upon the award-winning platform of the company's InTouchScope™, analytical SEM with intuitive touch screen control, and the widely used high-performance ...