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Recent Blogs

August 2016

Imaging a Spider Web with the SEM Imaging a Spider Web with the SEM
The challenge was to image the spider’s web without causing any induced stress or deformation of the structure as collected. The web was collected between two glass plates to protect the structure. The top glass plate was removed and the sample was transferred to an SEM holder that was configured as in the Photos. Top reference holder with cap removed. Top reference holder with carbon tape on the cap and with cap reinserted. Top reference holder ...
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Students Investigate Mechanical Properties of Spider Web Students Investigate Mechanical Properties of Spider Web
It isn't often that 8th graders inspire scientists with their class project. When a group of scientists at the Massachusetts Institute of Technology found that a spider's web from the basement had an unusual pattern, they invited a small team of middle school students to investigate its mechanical properties. Their work caught the attention of the MIT researchers and also landed a talk at M&M 2016. With the poster at M&M 2016: 8th grader Nicholas ...
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Recent JEOL in the News

Scientists image one of the largest viruses on the planet

Friday, March 31, 2017

Researchers retrofitted a transmission electron microscope with a cryostage, a device used to keep biological samples frozen in liquid nitrogen. Scientists used the JEOL cryo-electron microscope to map the Samba virus and observe it as the virus invaded an amoeba.

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Unexpected, Star-Spangled Find May Lead to Advanced Electronics

Tuesday, March 21, 2017
In an article published online March 10 in the journal Advanced Materials, Dr. Moon Kim and his colleagues describe a material that, wh...

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Synthetic Drug Use in Virginia Varies Dramatically Depending on Where You Live

Wednesday, March 15, 2017
If you think synthetic drugs are a "city" problem, think again. Police in Virginia say deadly variations are popping up all over the state i...

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Recent JEOL USA Press Releases

Unique Mass Spectrometer for Analysis of Semiconductor Process Gases

Wednesday, June 14, 2017
June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in s...

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JEOL Announces New Field Emission Scanning Electron Microscope

Thursday, June 1, 2017

Highest quality data and easiest operation

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JEOL Introduces World's Fastest Direct Write E-Beam Tool

Tuesday, May 16, 2017
May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company ...

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