JEOL USA JEM-2800 High Throughput TEM

Wednesday, June 19, 2013
Login
Register

PRODUCTS : Electron Optics : Transmission Electron Microscopes (TEM) : 200 kV : JEM-2800

JEOL Transmission Electron Microscopes

SerialEM Tomography Software

IMOD Tomography Software

Chimera Visualization Software

TEMography™

Sirius™ Remote Software

Automated Data Acquisition (JADAS)

Practical Remote In Situ Microscopy (PRISM)

Thin Film Phase Plate Technology

JEM-2200FS

Also See

Scanning Electron Microscopes (SEM)

Transmission Electron Microscopes (TEM)

Surface Analysis (SA)

Link to Mobile

View MOBILE SITE

Application Images

High sensitivity/high speed EDS.

Critical dimension measurements.

TEM image. Specimen: Au single crystal.

STEM HAADF image. Specimen: Si(110) single crystal.

SE image. Specimen: Au particles.

Spotlight

Watch news from the tradeshow floor:

Tom Isabell, director of JEOL’s TEM division, talks about the new EDS detector for JEOL’s TEMs.

High Throughput, Automated TEM, S/TEM, SEM and Analysis

The JEM-2800 is a high throughput nano-analysis TEM with automated functions, making it ideal for process and quality control of mass produced semiconductor and materials samples.

This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples.

An all-new design, the JEM-2800 functions without the use of fluorescent screen. It can be operated in a bright room and is clean room compliant.

JEM-2800 Details

Key Features
Specifications
Resources

Automated and User Friendly

The JEM-2800 has fully automatic functions including adjustment of focus, astigmatism, contrast, brightness, crystal zone axis alignment, and specimen height. Switching between analysis modes is seamless, and quick data collection shortens turnaround time between samples.

An operator navigation system and on-screen operating guide make the JEM-2800 a high throughput, user-friendly TEM for any skill level.

Fast Data Collection

The JEM-2800 achieves both high resolution imaging and high speed analysis. A variety of preset beam data are available to insure optimum settings for the sample or analyzing technique, enhancing the speed and accuracy of analysis.

Resolution
SEM image (edge to edge)	≤0.5nm (at 200 kV)
STEM image	0.2nm (at 200 kV)
TEM lattice image	0.1nm (at 200 kV)
Magnification (on 24-inch wide LCD)
SEM (MAG)	100 to 150,000,000x
STEM (MAG)	100 to 150,000,000x
TEM (MAG)	500 to 20,000,000x
Electron Gun
Electron Gun	Schottky-type electron gun
Accelerating voltage	200kV - 100kV
Specimen Stage
Stage	Eucentric side-entry goniometer stage (piezo drive is also available)
Specimen size	3mm diameter
Tilt angle	X: ±25° Y: ±30° (with double tilt holder)
Movement range	X, Y: ±1.0mm Z: ±0.2mm

Optional Accesories

Digital CCD Camera System
Energy-Dispersive X-ray Spectrometer (EDS)
Electron Energy-Loss Spectrometer (EELS)

Development of a High Throughput Electron Microscope for Nanoscale Analysis