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JEM-2800 Transmission Electron Microscope

High Throughput, Automated TEM, S/TEM, SEM and Analysis

Application Images
High sensitivity/high speed EDS.
Application Images
Critical dimension measurements.
Application Images
TEM image. Specimen: Au single crystal.
Application Images
STEM HAADF image. Specimen: Si(110) single crystal.
Application Images
SE image. Specimen: Au particles.

High Throughput, Automated TEM, S/TEM, SEM and Analysis

The JEM-2800 is a high throughput nano-analysis TEM with automated functions, making it ideal for process and quality control of mass produced semiconductor and materials samples.

This versatile TEM features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples.

An all-new design, the JEM-2800 functions without the use of fluorescent screen. It can be operated in a bright room and is clean room compliant.

JEM-2800 Details