Industry-leading FE-SEM for any type of sample, any type of analysis
The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis. JEOL's highest performance FE-SEM makes it possible to:
- observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution
- collect large area EBSD maps at low magnifications without distortion
- perform low kV imaging and analysis of highly magnetic samples.
- image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector
Optimized for extreme imaging and analysis
The JSM-7800F uniquely combines an in-lens field emission gun with an aperture angle control lens (ACL), optimizing large probe currents (up to 200 nA) for operation at the smallest probe diameter. The new super hybrid lens design allows high resolution imaging of any type of specimen. The SEM excels at low accelerating voltage X-ray spectroscopy and cathodoluminescence, combining large beam currents with a small interaction volume and dramatically increasing analytical resolution to the sub 100nm scale. Beam deceleration in GB Mode provides charge balance and extreme high resolution imaging of surfaces and nonconductive samples by effectively reducing effects of lens aberrations.
The JSM-7800F is suitable for a wide variety of applications, from cryo-microscopy to electron beam lithography. It accommodates multiple analytical attachments, including EDS, WDS, STEM, BSE, CL, EBIC, and an IR camera and stage navigation camera. The SEM comes with a choice of three stage sizes and three specimen exchange airlock sizes. It can also be equipped with tensile, heating, and cooling stages for in situ experiments.
The system can be configured for low vacuum operation for imaging non-conductive samples.