JEOL USA Blog

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STEM Students from Massachusetts Heading to M&M 2023

Middle and High School students from Massachusetts to present their research at Microscopy conference M&M 2023

M&M 2023 - Microscopy Community Comes Together in Minneapolis, Minnesota

Summary of JEOL’s participation in M&M July 2023 in Minneapolis

How do Ion Milling Systems Work?

Ion milling systems are used to prepare samples for analysis by removing the top layer of a sample. Read on for how ion milling systems work.

Microscopy Community Celebrates Wil Bigelow

Friends of Prof. Wilbur (Wil) Bigelow, Professor Emeritus at University of Michigan and Fellow of the Microscopy Society of America, threw a surprise 100th birthday party for him at the University of Michigan’s Dept. of Materials Science & Engineering in Ann Arbor.

Designing Better Batteries through Innovative Microscopy Characterization and Analysis

Learn more about JEOL's air-isolated workflow, pristine sample preparation of sensitive samples, and high-resolution imaging and analysis solutions.

Elemental Analysis with Electron Microscopes

Electron Microscopy Excels at Elemental Analysis

Discover how SEM and TEM microscopes are analytical tools that use Energy Dispersive X-ray detectors (EDS or EDX) and SXES for elemental analysis down to Lithium.

Achieving Pristine Cross Sections of Battery Samples for SEM

Achieving Pristine Cross Sections of Battery Samples for Scanning Electron Microscopy

JEOL’s Cooling Cross Section Polisher for Lithium Ion Batteries uses broad ion beam milling to prepare artifact-free cross-sections for SEM.

Choosing the right scanning electron microscope for your laboratory

This article introduces the imaging technique scanning electron microscopy (SEM) and gives readers guidance on the criteria to consider when choosing the right type of SEM instrument.