JEOL USA Blog

Middle and High School students from Massachusetts to present their research at Microscopy conference M&M 2023

Ion milling systems are used to prepare samples for analysis by removing the top layer of a sample. Read on for how ion milling systems work.

Friends of Prof. Wilbur (Wil) Bigelow, Professor Emeritus at University of Michigan and Fellow of the Microscopy Society of America, threw a surprise 100th birthday party for him at the University of Michigan’s Dept. of Materials Science & Engineering in Ann Arbor.

Learn more about JEOL's air-isolated workflow, pristine sample preparation of sensitive samples, and high-resolution imaging and analysis solutions.

Discover how SEM and TEM microscopes are analytical tools that use Energy Dispersive X-ray detectors (EDS or EDX) and SXES for elemental analysis down to Lithium.

JEOL’s Cooling Cross Section Polisher for Lithium Ion Batteries uses broad ion beam milling to prepare artifact-free cross-sections for SEM.

This article introduces the imaging technique scanning electron microscopy (SEM) and gives readers guidance on the criteria to consider when choosing the right type of SEM instrument.

FAU Owls Lab uses a unique biofilm for imaging microorganisms in the NeoScope Tabletop Scanning Electron Microscope

Two of the most popular electron microscopy methods make use of scanning electron microscopes (SEM) and transmission electron microscopes (TEM).