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How to Carry Out Particle Analysis with Benchtop SEM

Benchtop SEM is used in industry and academia to characterize nanosized particles’ morphological, topographical, and chemical characteristics.

How Benchtop SEM can Benefit Energy Storage Applications

Benchtop SEM is a key analytical tool in investigating materials' batteries, fuel cells, supercapacitors, electrolyzers and heterogeneous catalysts.

Elemental Analysis with Electron Microscopes

Electron Microscopy Excels at Elemental Analysis

Discover how SEM and TEM microscopes are analytical tools that use Energy Dispersive X-ray detectors (EDS or EDX) and SXES for elemental analysis down to Lithium.

Designing Better Batteries through Innovative Microscopy Characterization and Analysis

Learn more about JEOL's air-isolated workflow, pristine sample preparation of sensitive samples, and high-resolution imaging and analysis solutions.

Visualizing Elements Distributions with SEM-EDS Mapping

SEM-EDS mapping can help to analyze element distributions within various materials. Find out how this reliable method is utilized in our latest article!

High resolution backscattered electron image and corresponding EDS overlay map of a tungsten plug area

Why Use SEM-EDS for Advanced Materials Analysis?

Explore the pivotal role of SEM-EDS in advanced materials analysis, its applications, advantages, and future prospects in this informative technical article.

Pharmaceutical Imaging and Analysis: Advantages of Benchtop Scanning Electron Microscopy vs. Optical Microscopy

NeoScope benchtop SEM plays a pivotal role in pharmaceutical design and manufacture

Focus on MXenes, Materials, and Scanning Electron Microscopy

MXenes are a new family of 2D crystalline nanomaterials explored for energy applications using SEM microscopy

An SEM User’s Guide to Energy Dispersive Spectroscopy

Explore JEOL's Gather-X Windowless EDS: a breakthrough in SEM-EDS technology for unprecedented sensitivity and spatial resolution in elemental analysis.