JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)

  • Vol. 38 No. 2, 2003 Vol. 38 No. 2, 2003
    Atomic Resolved HAADF-STEM for Composition Analysis; Atomic Structure Analysis; Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM; Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution; Electron Spin Resonance (ESR) in Nanocarbon Research; Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy; JWS-3000 High-Resolution Review SEM; Application and Extension of Pickup Method to Various Materials; Introduction of New Products;
  • Vol. 38 No. 1, 2003 Vol. 38 No. 1, 2003
    Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image; Electron Holographic Analysis of Nanostructured Gold Catalyst; Single Atomic Column Observation in Silicon Boundary; The Scanning Electron Microscope as a Tool for Experimental Nanomechanics; Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy; Protein NMR - Ability of the JNM-ECA series; Development of the JBX-3030MV Mask Making E-Beam Lithography System; Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope; Peak Deconvolution Analysis in Auger Electron Spectroscopy II; Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer; Introduction of New Products;
  • Vol. 37 No. 1, July 2002 Vol. 37 No. 1, July 2002
    A Cs Corrected HRTEM: Initial Applications in Materials Science;Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction; Simulations of Kikuchi Patterns and Comparison with Experimental Patterns; Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study; Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM; A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality; Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS; Development of Nano-Analysis Electron Microscope JEM-2500SE; Development of JSM-7400F; New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials; Applications of Image Processing Technology in Electron Probe Microanalyzer; Technology of Measuring Contact Holes Using Electric Charge in a Specimen; Organic EL Display Production Systems - ELVESS Series; In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope; Peak Deconvolution of Analysis in Auger Electron Spectroscopy; JEOL's Challenge to Nanotechnology; Progress in Development of High-Density Reactive Ion Plating; Applications of High-Power Built-in Plasma Gun; Introduction of New Products;
  • Vol. 35 No. 1, July 2000 Vol. 35 No. 1, July 2000
    100kV E-Beam Lithography System: JBX-9300FS; Gate Oxide Characterization using Annualr Dark Field Imaging; JEOL Intro of New Products; Kankan Diamonds (Guinea): probing the lower mantle;
  • Vol. 34 No. 1, July 1999 Vol. 34 No. 1, July 1999
    A 1000kV TEM Running Over 25 Years; Atomic Resolution Z-Contrast Imaging of Interfaces and Defectst; The Growing Role of Electron Crystallography in Structural Biology; Factors Promoting R&D in Electron Microscopy in Japan; The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications; Immunogold-labeling in Scanning Electron Microscopy; Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope; Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer; Miniaturized STM Working Simultaneously in UHV Electron Microscope; High-Resolution Electron-Beam Lithography and Its Application toMOS Devices; Development of Optical Technology for JEOL's Electron Probe Instruments; Observation of Protein Structures through an Electron Beam; Transition of JEOL's Semiconductor Equipment, and Future Development; Applicatrion of Semi-in-Lens FESEM for Chargeless Observation; Development History of JEOL's Transmission Electron Microscopes;