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• Intuitive Workflows for Automated Particle Analysis using SEM/EDS

  The combination of Scanning electron microscope (SEM) imaging and embedded microanalysis (EDS) offers the perfect combination of direct particle visualization and chemical information at the same time. The recent emergence of automated solutions and multi area analyses has brought this technique to the forefront of the available automated particle analysis solutions.
• F2: Smart Design - Ergonomics

  The F2 incorporates a new, intuitive user interface specifically designed for analytical electron microscopy. This new interface integrates many improvements for the TEM control, such as; automatic functions (auto brightness/contrast, auto focus, auto Z, auto stigmator), coma free auto alignment and off-line data processing (Analysis Center). The software can be tuned at your convenience to provide you with the best working environment.
• Nanoscale Analysis: Latest Innovation in JEOL FE SEMs

  The ability to increase the probe current for fast microanalysis, while still maintaining a small spot size and small volume of excitation for high resolution, has been the holy grail of microanalysis in SEM. One of the unique features of JEOL’s FE SEMs is the patented Aperture Angle Control Lens (ACL). This lens automatically optimizes for both high resolution imaging at low probe currents and high spatial resolution X-ray analysis at high probe currents with a seamless transition between the two. This is essential for rapid analysis and superb image quality and is particularly true for low kV microanalysis. The ACL works by considering effects of all aberrations (spherical, chromatic and diffraction limitations) on spot size and automatically optimizing the convergence angle.
• Compact, Analytical SEM-EDS: JEOL’s Latest Generation InTouchScope™ JSM-IT200LA

  The JSM-IT200LA SEM delivers the ultimate user experience for high through- put imaging and elemental analysis. An embedded color camera simplifies specimen navigation, advanced automation delivers crisp secondary and backscatter images in seconds, and Real-Time (Live) EDS provides instant feedback of the specimen composition for intuitive operation at any experi- ence level. This All-in-One SEM also includes high and low vacuum modes for observation of a wide range of specimen types without compromise. All of this is delivered at a great value.
• Relativity – High Frame Rate Imaging With ANY Camera

  The IDES Relativity Electrostatic Subframing System multiplies the frame rate of cameras on JEOL TEMs. Microscopes equipped with Relativity achieve exceptional time resolution, data throughput, and advanced automation capabilities. Addition of Relativity allows current JEOL TEM users to forego expensive camera upgrades to their existing systems, instead relying on installation of an electrostatic optics assembly in a wide-angle camera port. These optics rapidly deflect the image data to different regions (subframes) of the camera in a programmable sequence. Each camera readout contains a tiled array of crisp, blur-free subframes. Raw data is automatically analyzed to give a stack of open format images that are loaded back into the camera control software for viewing or further analysis.
• Particle Analysis 3

  JEOL’s Particle Analysis Software 3 (PA3) enhances the capability of your analytical SEM by automating the detection, EDS analysis and classification of particles, grains or other features in your samples. Fully integrated with our SEM-EDS systems, PA3 increases throughput and productivity by providing fast, unattended measurements across large areas of a sample, or multiple samples.