JEOL USA Press Releases

Award-winning Scientist Visits JEOL USA during ACS Boston Conference

August 23, 2007 (Peabody, Mass.) -- JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters. Dr. Jinnai, an invited speaker at the American Chemical Society Fall conference held in Boston during the week of August 20th, uses a JEOL Transmission Electron Microscope (TEM) in his nanomaterials research at the ...

New Microscopes Aid Wesleyan Researchers

Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center has acquired a new, state-of-the art scanning electron microscope (JEOL JSM-6390LV SEM) for 3-D imaging, and a transmission electron microscope (JEOL JEM-1011 TEM) for 2-D sample images.

JEOL USA Completes “Super” Microprobe Installation at NIST

August 2, 2007 (Peabody, Mass.) -- JEOL USA, a leading supplier of electron microscopes and scientific instruments for nanotechnology, announced today that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at NIST in Gaithersburg, Maryland, in one of the world’s most technically advanced laboratories for developing new technologies and standards for a wide range of nanotechnology fields. A fully-automated, high-throughput versatile ...
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