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JIB-4500 MultiBeam SEM-FIB

JIB-4500 MultiBeam SEM-FIBMultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications.

Versatility

  • Low vacuum operation for imaging non-conductive specimens without coating or alteration
  • A gas injection system for etching and deposition
  • A large stage for up to 76mmΦ samples
  • A multiple port design for all your analytical needs

Productivity

  • Serial slicing and sampling (S3) for monitoring, slicing, fabrication and reconstructing 3D images
  • Maximum milling current for high throughput
  • Standard airlock system for fast sample loading

Stability

  • Provides stable imaging for milling / monitoring over extended periods of time
  • High throughput milling of large areas (max milling current 30 nA)
  • 5-axis eucentric goniometer stage

MultiBeam Features

Also see Applications of Multibeam SEM/FIB Instrumentation in the Integrated Sciences, as seen in Microscopy Today, July, 2009.