Focused ion beam technologies are considered to be the newest field of electron microscopy, being used for nanostructural analysis. Read on.
JEOL’s Cooling Cross Section Polisher for Lithium Ion Batteries uses broad ion beam milling to prepare artifact-free cross-sections for SEM.
This article introduces the imaging technique scanning electron microscopy (SEM) and gives readers guidance on the criteria to consider when choosing the right type of SEM instrument.
FAU Owls Lab uses a unique biofilm for imaging microorganisms in the NeoScope Tabletop Scanning Electron Microscope
Two of the most popular electron microscopy methods make use of scanning electron microscopes (SEM) and transmission electron microscopes (TEM).
Benchtop SEM is a key analytical tool in investigating materials' batteries, fuel cells, supercapacitors, electrolyzers and heterogeneous catalysts.
Benchtop SEM is used in industry and academia to characterize nanosized particles’ morphological, topographical, and chemical characteristics.
Tabletop Scanning Electron Microscopes are powerful tools for failure analysis, quality control and materials characterization in additive manufacturing.
The tabletop scanning electron microscope (tabletop SEM) will likely play a pivotal role in the rapid and efficient characterization of new drug treatments.