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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope™
HV/LV Tungsten/LaB6 SEMs
:
IT200
|
IT510
High-Res, Large-Chamber SEM
:
IT700HR
FE SEM
:
JSM-IT800
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
|
Carbon Coater
Microprobe (EPMA) and Auger
JXA-iHP200F
|
JXA-iSP100
|
JAMP-9510F
Additive Manufacturing
JAM-5200EBM 3D Printer
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NEOARM
|
CRYO ARM™ 200
|
JEM-F200
|
JEM-ACE200F
|
JEM-2100Plus
|
Monochromated ARM200F
300 kV
:
JEM-ARM300F2
|
CRYO ARM™ 300
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
|
JIB-4000PLUS
Medical Equipment
Industrial Equipment
Mass Spectrometers
AccuTOF™ DART®
AccuTOF™ GC-Alpha
AccuTOF™ GCxGC MS
AccuTOF™ LC-Plus
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
MALDI SpiralTOF™ TOF/TOF
MALDI Imaging SpiralTOF™
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
Delta NMR Software
CRAFT for Delta
NMR in Pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
|
JES-X320
|
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
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BLOG
JEOL USA Blog
Scanning Electron Microscopes Vs Transmission Electron Microscopes
Two of the most popular electron microscopy methods make use of scanning electron microscopes (SEM) and transmission electron microscopes (TEM).
2 MIN READ
|
421
|
SEM
,
TEM
What is MALDI Imaging Mass Spectrometry?
MALDI imaging mass spectrometry is a widely used soft ionization technique used to measure particularly fragile samples such as biomolecules
2 MIN READ
|
296
|
Mass Spec
How Benchtop SEM can Benefit Energy Storage Applications
Benchtop SEM is a key analytical tool in investigating materials' batteries, fuel cells, supercapacitors, electrolyzers and heterogeneous catalysts.
3 MIN READ
|
296
|
SEM
A New (Faster) Method for Pesticide Analysis: LPGC and Short Collision Cell Technology
Dramatically reduce analysis time of GC-MS/MS pesticide measurement by combining the separation efficiency and decreased elution time of an LPGC column with the enhanced SRM switching speed of the short collision cell of JEOL’s JMS-TQ4000GC.
2 MIN READ
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517
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Mass Spec
How to Carry Out Particle Analysis with Benchtop SEM
Benchtop SEM is used in industry and academia to characterize nanosized particles’ morphological, topographical, and chemical characteristics.
3 MIN READ
|
501
|
SEM
Discoveries in Disease Diagnostics: Exploring the Ear Canal with GC x GC-MS
Read more to learn how two-dimensional GC mass spectrometry (GC × GC–MS) can be applied for the characterization of the chemical components of earwax using non-polar (primary) and mid-polar (secondary) columns.
2 MIN READ
|
563
|
Mass Spec
Using Tabletop Scanning Electron Microscopes for AM Quality Control
Tabletop Scanning Electron Microscopes are powerful tools for failure analysis, quality control and materials characterization in additive manufacturing.
3 MIN READ
|
1001
|
SEM
Benefits of Tabletop SEM in Pharmaceutical R&D
The tabletop scanning electron microscope (tabletop SEM) will likely play a pivotal role in the rapid and efficient characterization of new drug treatments.
3 MIN READ
|
719
|
SEM
Using Triple-Quad Mass Spectrometry for Pesticide Analysis
Triple-quad mass spectrometers are particularly well-suited for pesticide analysis as they enable the quantification of a large number of compounds with excellent sensitivity. Read on.
3 MIN READ
|
361
|
Mass Spec
Pesticide Residue Analysis with GC-MS/MS
What is pesticide residue analysis, why is it important, and how can a GC-MS/MS instrument simplify this workflow?
3 MIN READ
|
573
|
Mass Spec
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