JEOL Collaborators renowned for their innovations with JEOL Electron Microscopes
JEOL USA congratulates University of Tokyo Professor Yuichi Ikuhara and Professor Naoya Shibata, recently awarded the Japan Academy Prize for development of State-of-the-Art Electron Microscopy and their contribution to Nano Interface Technology (Joint Research). As corroborators with JEOL, their work in developing the Magnetic-field-free Atomic-Resolution STEM (MARS), Annular Bright Field (ABF), and Optimum Bright Field STEM detector (OBF) is invaluable.
Ikuhara and Shibata have worked together to pioneer the cutting edge of scanning transmission electron microscopy (STEM) and to solve various problems in nanomaterials science, including:
- Establishing quantitative evaluation methods for local atomic structures and electronic states such as interfaces and dislocations
- Achieving the world's highest resolution of 40.5 pm using GaN, direct observation of light elements, high-resolution in-situ observation, etc.
- Developing numerous sophisticated analysis methods using TEM, such as:
- Determining the correlation between interfacial atomic/electronic structure and functional properties, the relationship between identification of atomic positions of light elements and physical properties, elucidation of dislocation core/lattice defect structure, elucidation of material deformation and fracture mechanism, ceramics grain boundary segregation mechanism
- Direct observation of the electric field inside the atom/observation of the atomic magnetic field.
- Ultimately, developing new STEM detectors including Annular Bright Field (ABF) and atomic resolution magnetic field-free electron microscopes (MARS)
Based on these series of research results, Ikuhara and Shibata are constructing the theory of nano-interface engineering leading to the design and creation of new materials focusing on the functions of interfaces and lattice defects.