Throughout the discovery and manufacturing phases of bringing pharmaceuticals to market, scanning electron microscopy (SEM) plays a pivotal role in design and quality control. For visual inspection, the benchtop SEM far surpasses the capabilities of traditional optical or light microscopy with its large depth of field and functionality.
With the JEOL NeoScope Benchtop SEM
it is possible to observe the compositional contrast that cannot be seen on an optical image. Examination of a pharmaceutical tablet or powder sample in the benchtop SEM reveals greater detail and compositional contrast than can be achieved with optical microscopes, even at the same magnification. With magnification up to 100,000X and versatile, automated settings, the SEM makes it possible to easily inspect the microstructure of tablets and powders, textures and coatings, foreign particles, and their chemical composition. Using the benchtop SEM, it is possible to identify the source of contamination from manufacturing processes.