JEOL USA Press Releases

August 3, 2020, Peabody, Mass. JEOL expands its revolutionary FE SEM product group with the introduction of a compact, versatile Field Emission SEM that offers ultrahigh resolution and versatile analytical capabilities at a great value. The new JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded ...

July 1, 2020 Peabody, Mass. – The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale. Capabilities include up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making ...

May 21, 2020 (Peabody, MA) – JEOL USA announces that it has been awarded a major contract by the US Department of Homeland Security Customs and Border Protection for five JEOL AccuTOF-DART Direct Analysis in Real Time, Time-of-Flight Mass Spectrometers. These instruments will enhance the analytical capabilities of five US Customs and Border Protection laboratories across the country. Three additional labs already installed the AccuTOF-DART in recent years, bringing the total usage to eight ...

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to highlight its latest key strategic partnerships at Pittcon 2020: Mass-Spectrometry: NETZSCH integrated Thermal Analysis GC/MS system Electron Microscopy: Acquisition of Integrated Dynamic Electron Solutions, Inc. NMR Spectroscopy: RIKEN-JEOL Collaboration Center and the Kyoto University Bob Pohorenec, JEOL USA’s President commented: “JEOL is committed to developing cutting edge technologies to help scientists to answer ever-complex questions. Our ...

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020.  JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more than 50 years of e-beam lithography leadership. Mass spectrometry (MS) JEOL expanded its mass spectrometer product line with the development ...

January 23, 2019 – Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM. "JEOL’s F100 FE-SEM offers a truly ...

11 JUNE 2019, PEABODY, MA: JEOL USA has announced the addition of two new products to its nuclear magnetic resonance (NMR) portfolio. The  2mm Magic Angle Spinning (MAS) NMR Probe for Solids and Pre-Heat Auto-Sample Changer (ASC) expand JEOL’s extensive offering of advanced NMR solutions for polymer research, materials science and biosolids. The 2mm MAS NMR Probe is well suited for both materials and biosolids NMR. The 2mm MAS Probe is the ideal compromise in ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA has expanded its mass spectrometer product line with the development of a new GC-triple quadrupole mass spectrometer system introduced at the Pittcon Conference in Philadelphia this week in booth #3035. The new JMS-TQ4000GC answers the need for an ultrahigh-speed triple-quadrupole mass spectrometer that accurately measures trace or residual pesticides in agricultural materials, trace levels of regulated chemicals in tap water, and simplifies quantitative analysis of ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA JEOL USA has established an OEM agreement with SpectralWorks, Ltd. (UK) to distribute AnalyzerPro® software for use with JEOL’s mass spectrometer systems.  AnalyzerPro®’s functions for chromatographic deconvolution, target compound identification, sample-to-sample comparison and chemometric analysis provide powerful tools for examining the data from JEOL’s mass spectrometers, in particular the JEOL AccuTOF-GCx-plus high-resolution time-of-flight GC/MS system.  Example applications of AnalyzerPro® with the AccuTOF-GCX-plus include analysis of coffees ...

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in ...