Analysis of additive in film by using single-scan mode of GC/MS/MS
Introduction
GC triple quadrupole mass spectrometer JMS-TQ4000GC UltraQuadTM TQ (Fig. 1) can be used as QMS through its single QMS mode in addition to qualitative and quantitative analysis of trace components by MS/MS mode. In general, it is said that the sensitivity of single QMS mode in GC/MS/MS is lower than that of QMS due to the longer distance from the ion source to the detector. However, the JMS-TQ4000GC reduces the sensitivity reduction by (1) achieving high ion transmission through the high-precision large hyperbolic quadrupole, (2) reducing ion loss through the extremely short collision cell transit time by using a “Short collision cell”, (3) eliminating noise-causing neutral particles through the parallel plate electrostatic deflector installed in front of the detector. In this application, we report on the verification of whether additive analysis in materials can be performed in the same way as conventional QMS using the single QMS mode, and also conducted analysis using msFineAnalysis iQ.