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JEOL Resources

Documentation in support of your JEOL product.

Learning Polymer Materials Analysis from Natural Lacquer (Urushi)

Introduction: In recent years, polymer materials have become more complex due to increased composition and diversification so that a one-sided analysis is insufficient and multifaceted observations and analyses are required. In response to this need, JEOL has engaged in applied research under the keyword of "YOKOGUSHI" (multifaceted cross-instrumental) using various instruments organically. In this Urushi Note, multifaceted analysis methods for polymer materials are illustrated using the examples of natural lacquer (urushi) analysis.

Gold Star Mothers Stamp - Analysis Using Scanning Electron Microscopy and Mass Spectrometry

Since 1949, the JEOL legacy has been one of outstanding innovation in developing instruments used to advance scientific research and technology. JEOL has over 60 years of expertise in the field of electron microscopy, more than 50 years in mass spectrometry. In this applications note, we performed an analysis of a Gold Star Mothers Postage Stamp by using three JEOL instruments. We used the JSM-IT300LV which the latest addition to JEOL‘s popular series of analytical low vacuum SEM, , the JMS-T100LP “AccuTOF- DART” the first commercially available ambient ionization mass spectrometer, and the JMS-S3000 “SpiralTOF” which has highest mass-resolution and mass accuracy of all commercially available MALDI-TOFMS systems. We can therefore correlate analyses from various analytical techniques on the same sample.

Rapid Identification of Smokeless Powders

Smokeless powders are often used in improvised explosive devices. The formulations for smokeless powders vary between manufacturers and between brands from a given manufacturer; ingredients include energetics, stabilizers, plasticizers and deterrents. Both chemical composition and morphology are important in characterizing smokeless powders. Chemical analysis of smokeless powders can provide valuable forensic evidence. Observation with the SEM can reveal morphological information to help with identification. Here we show how SEM-EDS analysis can be used to identify inorganic components, and how the AccuTOF-DART mass spectrometer can rapidly identify the organic components and provide a chemical fingerprint that can be used to identify individual powder particles.

Identification of Contamination on Welding Wires Using Cross-Platform Techniques in SEM and Mass Spec

A batch of contaminated welding wire received from a vendor by a customer was causing problems in a manufacturing process. Visual comparison of the clean and contaminated wire did not show any obvious differences, but the contamination was readily observed on backscatter electron images obtained with the JEOL IT300 scanning electron microscope.

Analysis of duct tapes by thermal desorption and pyrolysis mass spectrometry and X-ray-fluorescence spectroscopy

The identification of pressure-sensitive tapes such as duct tape and electrical tape is an important forensic application. Here we show the application of thermal desorption and pyrolysis combined with Direct Analysis in Real Time (DART) mass spectrometry to distinguish between manufacturers and brands of duct tapes. X-ray fluorescence (XRF) provides complementary information about the atomic composition of the different tapes.

Other Resources

The following resources are available for the JEOL Analytical Instruments:

Media

Corona - Glow Discharge (DART Ion Source)

February 22, 2020
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