In the industrial field, there is interest in measuring organic compounds on non-conductive substrates, such as resins a few millimeters thick. If the mass spectrum is obtained from the non-conductive surface with no pre-treatment, the mass resolution will be lower, and ultimately the ion intensity will decrease significantly due to the charge-up effect. This issue can be solved by providing conductivity to the non-conductive part via the gold deposition method. In this report, MSI is performed using a permanent red marker on a substrate with a conductive part and a non-conductive part. Previously, ions could be observed only from the conductive part. Now, with the gold deposition method, they can be observed from both the conductive and the non-conductive parts, and they can be properly mapped.