EDS mapping using a mask for high-dead-time (heavy-element) regions
If a specimen studied by EDS mapping contains regions with heavy elements, those regions generate many X-rays. This increases dead time as X-rays can pile up faster than the detector can separate them. In extreme cases, the EDS map may show almost no X-rays at all in such regions even while the rest of the sample is mapped accurately.
With Dose Painting using EDM Synchrony, the user can define an arbitrary “mask,” freely and independently controlling the beam current in every pixel. This lets you reduce the current in heavy-element regions, reducing pileup and allowing EDS acquisition from light-element and heavy-element regions in a single scan.