Low kV Multispectral Imaging in a Field Emission SEM
Successful imaging and characterization of nanomaterials, composites and biological specimens require unsurpassed performance in the low and ultra-low kV range in FEG-SEM for both imaging and analytical modes. The state-of-the-art FEG-SEM should show superb resolution with various detectors at a wide range of accelerating voltages and have the ability to perform fast and reliable microanalysis at low kV using high probe currents, without loss of spatial resolution and with an ease of operation.
The new JSM-7600F Schottky FEG-SEM from JEOL combines two proven technologies – an electron column with semi-in lens detectors and an in-the-lens Schottky field emission gun - to deliver ultrahigh resolution combined with wide range of probe currents for all applications (from 1pA to more than 200nA). It delivers unsurpassed imaging performance at ultra low kV, with 1.5 nm resolution at 1 kV and 5 nm at 0.1 kV.