Scanning Electron Microscope A to Z: Basic Knowledge for using the SEM April 2, 2020 Scanning Electron Microscope (SEM) 0 Since the Scanning Electron Microscope (SEM) was first commercialized about 40 years ago, the SEM has shown a remarkable progress. Now, many types of SEMs are being used, and their performance and functions are greatly different from each other. To utilize these different SEMs, it is essential to recognize their features, as well as to understand the reasons for the contrast of SEM images. Thus, this document material is aimed at helping SEM users and future SEM users to understand the basics of the SEM, including the instrument principles, specimen preparation and elemental analysis. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. resources_eo/JEOL Scanning Electron Microscope (SEM) A to Z.pdf 735.58 KB Related Articles A Guide to Scanning Microscope Observation We included in this book as many application examples as possible so that they can be used as criteria for judging what causes unsatisfactory image factors (hereinafter referred to as image disturbances). Although this edition does not describe all about image disturbances, it carries application photos to allow you to consider their causes. It is also important to correctly select the optimum observation conditions for various specimens. For instance, this book carries matters which are considered to be useful for using the instrument, such as the accelerating voltage, probe current and working distance (hereinafter abbreviated to WD). Invitation to the SEM World For people who are using the SEM for the first time. Includes topics such as What is the SEM, Observation Examples, Specimen Preparation and Observation Technique, Functions of SEM's Individual Components, New Functions of SEM, Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope, and Description of Terms. Showing 0 Comment Comments are closed.