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Cross Section Polisher (CP) for SEM Sample Preparation

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Paper
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Wire bond
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Wire bond EDS analysis
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Paint EDS analysis
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Yeast
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Oil shale
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Solder
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AlSiC ceramic

Prepare to be amazed. JEOL’s Cross Section Polisher produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation.

The ability to create perfect cross sections of paper, shale, yeast, latex beads, coatings, and wire bonds, or to create a mirrored surface on soft materials such as gold, polymers, ceramics, and glass has greatly enhanced research and analysis for many of our customers.

The CP uses an argon beam to mill cross sections or polish virtually any material that is affixed to the continuously rotating sample holder. The high power optical microscope allows the user to position a sample to within a few microns of the precise cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface.

Let us show you the remarkable capabilities of this sample preparation instrument for your own samples.

Spotlight

Cross Section Polisher (CP) Details

Rotating Sample Holder
Rotating Sample Holder