Request Product InfoFind a Local OfficeSearch
 
JEOL
Thursday, July 24, 2014
Login
Register
Sample Prep.
Products
Sample Prep.
Resources
Link to Mobile
Application Images
Paper
Wire bond
Wire bond EDS analysis
Paint EDS analysis
Yeast
Oil shale
Solder
AlSiC ceramic
Spotlight
Cross Section Polisher (CP) for SEM Sample Preparation

Prepare to be amazed. JEOL’s Cross Section Polisher produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation.

The ability to create perfect cross sections of paper, shale, yeast, latex beads, coatings, and wire bonds, or to create a mirrored surface on soft materials such as gold, polymers, ceramics, and glass has greatly enhanced research and analysis for many of our customers.

The CP uses an argon beam to mill cross sections or polish virtually any material that is affixed to the continuously rotating sample holder. The high power optical microscope allows the user to position a sample to within a few microns of the precise cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface.

Let us show you the remarkable capabilities of this sample preparation instrument for your own samples.

Cross Section Polisher (CP) Details
Rotating Sample Holder
Rotating Sample Holder

 
  Copyright 2014 JEOL USA, Inc. | Privacy Statement | Terms Of Use
  Designed & Powered by the Swanzey Internet Group