JEOL USA Press Releases

JEOL USA highlights new strategic partnerships strengthening its position as world-leading instrument provider

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to highlight its latest key strategic partnerships at Pittcon 2020: Mass-Spectrometry: NETZSCH integrated Thermal Analysis GC/MS system Electron Microscopy: Acquisition of Integrated Dynamic Electron Solutions, Inc. NMR Spectroscopy: RIKEN-JEOL Collaboration Center and the Kyoto University Bob Pohorenec, JEOL USA’s President commented: “JEOL is committed to developing cutting edge technologies to help scientists to answer ever-complex questions. Our ...

JEOL USA showcases product updates in MS, SEM and NMR

2 March 2020, PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020.  JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more than 50 years of e-beam lithography leadership. Mass spectrometry (MS) JEOL expanded its mass spectrometer product line with the development ...
JMS-TQ4000GC Triple Quadrupole Mass Spectrometer

JEOL Introduces New GC/Triple Quadrupole Mass Spectrometer with High Speed and High Sensitivity for Trace Detection of Pesticides, Dioxins, and Regulated Chemicals

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL USA has expanded its mass spectrometer product line with the development of a new GC-triple quadrupole mass spectrometer system introduced at the Pittcon Conference in Philadelphia this week in booth #3035. The new JMS-TQ4000GC answers the need for an ultrahigh-speed triple-quadrupole mass spectrometer that accurately measures trace or residual pesticides in agricultural materials, trace levels of regulated chemicals in tap water, and simplifies quantitative analysis of ...
SpectralWorks, Ltd. OEM agreement

JEOL Establishes OEM Agreement with SpectralWorks, Ltd.

March 19, 2019 - Pittcon 2019 – Philadelphia, PA JEOL USA has established an OEM agreement with SpectralWorks, Ltd. (UK) to distribute AnalyzerPro® software for use with JEOL’s mass spectrometer systems.  AnalyzerPro®’s functions for chromatographic deconvolution, target compound identification, sample-to-sample comparison and chemometric analysis provide powerful tools for examining the data from JEOL’s mass spectrometers, in particular the JEOL AccuTOF-GCx-plus high-resolution time-of-flight GC/MS system.  Example applications of AnalyzerPro® with the AccuTOF-GCX-plus include analysis of coffees ...
msFineAnalysis

JEOL Develops new Qualitative Analysis Software for GC-Mass Spectrometry

March 19, 2019 - Pittcon 2019 – Philadelphia, PA  JEOL has developed a new software package, msFineAnalysis, to enhance qualitative analysis of compounds using high-resolution GC-mass spectrometry. The new software takes qualitative GC-MS analysis to a whole new level with the JEOL AccuTOF-GCx PLUS mass spectrometer. msFineAnalysis integrates the information from multiple ionization techniques with database search, exact mass, and isotope data. The report compares the spectral matches from a NIST or NIST-formatted mass spectral ...
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New MALDI Imaging Applications Note

(August 24, 2017 – Peabody, Mass.)  JEOL USA has produced a new MALDI imaging technical applications note that describes the unique analytical process for a variety of biological and organic samples. MALDI imaging is a powerful mass spectrometry technique available with JEOL’s MALDI Imaging SpiralTOF. It is used to assess the distribution of proteins, peptides, lipids, drugs, and metabolites in tissue specimens, as well as compound distribution in organic materials. MALDI is an acronym ...

Unique Mass Spectrometer for Analysis of Semiconductor Process Gases

June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N2, or N2O and CO2, for continuous monitoring without chromatography.  This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in ...

JEOL Highlights New Analytical Technologies at ASMS 2016

June 2, 2016 (Peabody, Mass.) -- JEOL USA will unveil several new analytical technologies during ASMS 2016 in San Antonio, Texas (Booth #229). With a comprehensive line of time-of-flight mass spectrometers, JEOL advances analytical capabilities for a wide range of scientific research. JEOL and the company's mass spectrometry customers will present several posters at ASMS. In particular, one oral presentation by collaborators at University at Albany will detail the use of AccuTOF-DART for "Classification of ...

JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the size of a personal computer tower. Featuring a mass resolving power of up to 30,000, the InfiTOF can easily separate isobaric species such as CO+ and N¬2+ without chromatography. ...

New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer

March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. The new EI/PI source complements the dedicated electron ionization (EI), positive/negative chemical ionization (CI), field desorption/field ionization (FD/FI) and combination EI/FI/FD ion sources and direct probes that make the GCX the most versatile GC/TOF and GCxGC/TOF system available. Much like field ionization, photoionization is a soft ionization method that ...
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