Forensic Analysis Brochure
JEOL, a world leader in SEM technology for six decades, offers scanning electron microscopes that enable imaging and analysis of the smallest details in forensic microscopy. JEOL SEMs are used for crime scene investigation, accident reconstruction, ballistics, explosives detection, toxicology, arson investigation, automated gun shot residue analysis, trace evidence, and failure analysis. The imaging and analytical ability of JEOL SEMs reveal physical and chemical evidence that might otherwise be easily overlooked.
A Closer Look
The JEOL JSM-6610LV SEM is a highly flexible, high performance SEM uniquely suited to the investigative needs of crime laboratories and forensic science centers. The JSM-6610LV is ideal for forensic microscopy of trace evidence and automated GSR. Investigators can calculate 3D measurements from stereo images, contrast and compare fine details, and determine elemental composition. With its large specimen chamber and automated eucentric stage, the JSM-6610LV can accommodate large pieces of evidence in their native state for both imaging and chemical analysis.