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JEOL Resources

Documents of interest in support of your JEOL product

Invitation to the SEM World

This document includes:

  • What is the SEM?
  • Observation  Examples
  • Specimen Preparation and Observation Technique
  • Functions of SEM's Individual Components
  • New Functions of SEM
  • Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope
  • Description of Terms

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Other Resources

The following resources are available concerning Electron Optic related instruments:

  • Image Gallery
    -View a selection of electron images
  • FAQs
    -See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    -View our page of useful and interesting links to various electron microscopy resources
  • Videos
    -View some product presentations of our instruments
  • SEM Theory and SEM Training

Request Technical Documents for JEOL EPMA (Microprobes)

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  • Technical Documentation for JEOL EPMA (Microprobes)