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JEOL Scanning Electron Microscopes

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JEOL EPMA (Microprobes)

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JEOL Electron Optic Resources

Documents of interest in support of your JEOL product

Invitation to the SEM World

This document includes:

  • What is the SEM?
  • Observation  Examples
  • Specimen Preparation and Observation Technique
  • Functions of SEM's Individual Components
  • New Functions of SEM
  • Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope
  • Description of Terms

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Other Resources

The following resources are available concerning Electron Optic related instruments: