SEM Q&A April 2, 2020 Scanning Electron Microscope (SEM) 0 JEOL is always making efforts to meet the needs of our customers in all areas including hardware and software of our instruments. Our efforts to grasp customer requirements include question and answer opportunities during technical seminars and meetings. Based on these questions, we have published this Q&A book. We hope this book will help you solve various problems encountered during your daily research. Also, we would appreciate it if you could give us constructive comments to refine the contents of this book. JEOL Ltd. JEOL DATUM Ltd. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. resources_eo/JEOL SEM Q&A e.pdf 1.46 MB Related Articles Nanoscale Analysis: Latest Innovation in JEOL FE SEMs The ability to increase the probe current for fast microanalysis, while still maintaining a small spot size and small volume of excitation for high resolution, has been the holy grail of microanalysis in SEM. One of the unique features of JEOL’s FE SEMs is the patented Aperture Angle Control Lens (ACL). This lens automatically optimizes for both high resolution imaging at low probe currents and high spatial resolution X-ray analysis at high probe currents with a seamless transition between the two. This is essential for rapid analysis and superb image quality and is particularly true for low kV microanalysis. The ACL works by considering effects of all aberrations (spherical, chromatic and diffraction limitations) on spot size and automatically optimizing the convergence angle. Scanning Electron Microscope A to Z: Basic Knowledge for using the SEM Since the Scanning Electron Microscope (SEM) was first commercialized about 40 years ago, the SEM has shown a remarkable progress. Now, many types of SEMs are being used, and their performance and functions are greatly different from each other. To utilize these different SEMs, it is essential to recognize their features, as well as to understand the reasons for the contrast of SEM images. Thus, this document material is aimed at helping SEM users and future SEM users to understand the basics of the SEM, including the instrument principles, specimen preparation and elemental analysis. A Guide to Scanning Microscope Observation We included in this book as many application examples as possible so that they can be used as criteria for judging what causes unsatisfactory image factors (hereinafter referred to as image disturbances). Although this edition does not describe all about image disturbances, it carries application photos to allow you to consider their causes. It is also important to correctly select the optimum observation conditions for various specimens. For instance, this book carries matters which are considered to be useful for using the instrument, such as the accelerating voltage, probe current and working distance (hereinafter abbreviated to WD). Invitation to the SEM World For people who are using the SEM for the first time. Includes topics such as What is the SEM, Observation Examples, Specimen Preparation and Observation Technique, Functions of SEM's Individual Components, New Functions of SEM, Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope, and Description of Terms. Showing 0 Comment Comments are closed.