JMS-S3000 SpiralTOF™ series Polymeric Materials Applications Notebook
Edition May 2026
Table of Contents
Co-polymers / Co-oligomers P1〜
- High-Resolution MALDI-TOFMS Measurement and KMD Analysis for Visualization of Polymers Fractionated by Reversed-Phase LC (MSTips No. 503)
- Analysis of multicomponent polyesters using JMS-S3000 “SpiralTOF™-plus3.0” and Kendrick Mass Defect (KMD) analysis (MSTips No. 484)
- EO/PO composition ratio analysis of EO-PO copolymer using JMS-S3000 "SpiralTOF™-plus3.0" and "msRepeatFinder" (MSTips No. 471)
- Structural analysis of EO-PO copolymers using high-resolution MALDI-TOFMS and NMR (MSTips No. 423)
- Composition analysis of EO-PO copolymers using JMS-S3000 “SpiralTOF™-plus2.0” and “msRepeatFinder V6” (MSTips No. 399)
- “Fraction base” KMD plots for a high molecular weight poly(3-hydroxybutyrate-co-3-hydroxyvalerate) copolyester following its on-plate alkaline degradation and SpiralTOF™ analysis (MSTips No. 284)
- Analysis of EO-PO Random Copolymer by Using a Conventional HPLC and MALDI SpiralTOF™ MS (MSTips No. 203)
- Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory (Sato, H., JEOL News, 50, 46-52, 2015)
- MALDI SpiralTOF high-resolution mass spectrometry and Kendrick mass defect analysis applied to the characterization of poly(ethylene-co-vinyl acetate) copolymers (Fouquet, T., Nakamura, S. & Sato, H., Rapid Commun. Mass Spectrom. 30, 973 - 981, 2016)
Polymers / Oligomers P43〜
- An attempt at end-group analysis of polycarbonates up to 100,000 molecular weight using SEC preparative separation and NewSpiralTOF™ (MSTips No. 527)
- Combining JMS-S3000 "SpiralTOF™-plus3.0" and size exclusion chromatography to analyze the end groups of high dispersity synthetic polymers and visualizing changes in the end groups (MSTips No. 495)
- Assessing UV Degradation of Polymers: A Study of Polyethylene Terephthalate by using MALDI-TOFMS and GC-TOFMS
- Differential analysis of UV degradaed polyethylene terephthalate using JMS-S3000 “SpiralTOF™-plus2.0” and “msRepeatFinder” (MSTips No. 422)
- Structural analysis of polyethylene terephthalates with different crystallinity using JMS-S3000 “SpiralTOF™-plus 2.0” (MSTips No. 407)
- End group analysis of poly(methyl methacrylate) using MALDI-TOFMS and GC-TOFMS (MSTips No. 404)
- Analysis of mPEG5K-Phosphate using JMS-S3000 "SpiralTOF™-plus 2.0" (MSTips No. 402)
- Elemental Composition Determination of Polymer End Groups Using Accurate Mass (MSTips No. 357)
- Structural analysis of anionic surfactants in MALDI negative ion mode using "SpiralTOF™-plus" (MSTips No. 333)
- Analysis of degraded polymethyl methacrylate by UV irradiation using high-resolution MALDI-TOFMS and pyrolysis-GC-QMS (MSTips No. 324)
- Analysis of degraded polystyrene by UV irradiation using high-resolution MALDI-TOFMS and pyrolysis-GC-QMS (MSTips No. 322)
- Structural analysis of polyethylene terephthalate combining an on-plate alkaline degradation method and tandem time-of-flight mass spectrometry (MSTips No. 311)
- “Fraction base” KMD plots for a high molecular weight poly(3-hydroxybutyrate) polyester following its on-plate alkaline degradation and SpiralTOF™ analysis" (MSTips No. 283)
- Visualizing fragmentation channels of polyethylene oxide with different end groups using the JMS-S3000 SpiralTOF™ with TOF-TOF option (MSTips No. 279)
- “Remainders of KM” plot for polymers using msRepeatFinder: Intuitive display of High energy collision induced dissociation mass spectra acquired by SpiralTOF™/TOF (MSTips No. 270)
- “Remainders of KM” plot for polymers using msRepeatFinder: compositional mapping over a broad mass range (MSTips No. 269)
- Analysis of low molecular weight polyethylene with solvent-free method using JMS-S3000 “SpiralTOF™” (MSTips No. 235)
- Analysis of cyanoacrylate adhesive using the JMS-S3000 “SpiralTOF™” ― Application of Kendrick Mass Defect plot analysis ― (MSTips No. 220)
- Measurement of a Dendritic MS Reference Standard
- Analysis of high molecular weight polystyrene standards by using JMS-S3000 SpiralTOF™ with Linear TOF option (MSTips No. 199)
- Measurement of Synthetic Polymers [1]: Polystyrene (MSTips No. 163)
- Measurement of Synthetic Polymers [2]: Polymethyl Methacrylate (MSTips No. 164)
- Measurement of Synthetic Polymers [3]: Polyethylene Glycol (MSTips No. 165)
Polymer Additives P109〜
- Structure analysis of a polymer additive using high-energy collision-induced dissociation mass spectra acquired by JMS-S3000 with TOF/TOF option (MSTips No. 254)
- MALDI for Polymer Analysis: Synthetic Polymers and Additives (MSTips No. 205)
Mass Spectrometry Imaging P115〜
- Degradation analysis of polyethylene terephthalate film by UV irradiation using imaging mass spectrometry and scanning electron microscopy (HS05)
- Mass spectrometry imaging for degradation of polyethylene terephthalate by UV irradiation using JMS-S3000 “SpiralTOF™-plus” (MSTips No. 307)
- A mass spectrometry imaging method for visualizing synthetic polymers combined with Kendrick mass defect analysis (MSTips No. 306)
- A mass spectrometry imaging method for visualizing synthetic polymers by using average molecular weight and polydispersity as indices. (MSTips No. 305)
- Mass spectrometry imaging on mixed conductive/non-conductive substrate using JMS-S3000 SpiralTOF™ (MSTips No. 288)
- Analysis of organic compounds on an acrylic plate using JMS-S3000 “SpiralTOF™” (MSTips No. 251)
- Ballpoint Ink Analyses Using LDI Imaging and SEM/EDS Techniques (MSTips No. 204)
- Gunshot Residues (GSR) Analysis by Using MALDI Imaging
- Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF™” (Satoh, T., JEOL News, 49, 81-88, 2014)
Details of the hardware and software P149〜
- Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOF™-plus” Matrix Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometer (Takaya Satoh, JEOL News, 55, 70-72, 2020)
- Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory (Takaya Satoh, JEOL News, 45, 34-37, 2010)
- Development of peak extraction method from a high-resolution MALDI-TOF mass spectrum by machine learning focusing on peak shape, and an application to synthetic polymer analysis (MSTips No. 352)
- The Relationship between Crystal Condition and Mass Resolving Power, Mass Accuracy (MSTips No. 206)
- High Mass Resolution MALDI-Imaging MS - High Stability of Peak Position during Imaging MS Measurement (MSTips No. 193)