Electron Optic Documents

The JEOL Environmental Airlock system allows for the simple transfer of reactive specimens to the SEM without being exposed to air. For specimens where any exposure to air or moisture can alter or destroy the structure, this system provides a cost effective and simple method to bring specimens from a glove box directly to the SEM.

In the last decade there has been a quantum leap in the ability of scanning electron microscopes to observe a variety of materials and biological specimens with ultrahigh resolution and exceptional surface detail, in particular employing low voltage SEM. Low voltage imaging has become a key technique for charge control and reduction, especially in the cases where no surface modification (for example conductive coating) can be employed to alleviate specimen charging during SEM observation.

One of the main imaging artifacts generated during specimen observation in SEM is specimen charging. The effect of charging manifests itself either via ‘flattening’ of the image due to the beam deflection close to the source of charging, or extremely high or low contrast and image distortion. This artifact can be substantially reduced by either application of conductive coating to the sample or by lowering the primary beam voltage. Contemporary FE-SEMs have the ability to produce nm size spot sizes even at 1kV and below, paving the way for high resolution imaging and analysis of nanomaterials and surfaces without the need for conductive coating.

The quest for renewable energy sources is prompting the development of technologies capable of tapping into alternative energy sources such as solar, wind, geothermal and tidal energy. To fully exploit these energy sources, engineers need novel ways of storing and converting these energies.

Graphene is a crystalline form of carbon defined as a hexagonal arrangement of carbon atoms in a one-atom thick planar sheet. Graphene has outstanding properties (mainly mechanical strength, optical transparency and excellent electrical and heat conductivity) that make it an attractive material for electronics applications. Traditionally, graphene structures have been imaged with aberration-corrected TEM, AFM, or STM.

The combination of Scanning electron microscope (SEM) imaging and embedded microanalysis (EDS) offers the perfect combination of direct particle visualization and chemical information at the same time. The recent emergence of automated solutions and multi area analyses has brought this technique to the forefront of the available automated particle analysis solutions.

For people who are using the SEM for the first time. Includes topics such as What is the SEM, Observation  Examples, Specimen Preparation and Observation Technique, Functions of SEM's Individual Components, New Functions of SEM, Comparison of Scanning Electron Microscope with Optical Microscope and Transmission Electron Microscope, and Description of Terms.

SEM is a natural extension to viewing specimens with an optical microscope due in part to its inherent higher depth of field and ability to resolve smaller microstructures. Creating a 3-dimensional (3D) surface model can further enhance our understanding with specimens that have complex topographical features.

JEOL SEMs are delivered with the capability for remote viewing and remote operation. The SEM computer includes a 2nd ethernet card for connection to your local area network. There is no need for a second support computer. Just connect your JEOL SEM computer to a reliable and fast broadband internet connection and choose the software platform that meets your remote access requirements.

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