Electron Optic Documents


JEOL Resources

Documents of interest in support of your JEOL product

Stage Navigation System

Effortless sample navigation using JEOL’s Stage Navigation System (SNS). This system includes a high resolution, color CMOS camera mounted on the top of the SEM sample chamber, which captures a picture of the sample mounted on the stage. From this color picture, the user can control the position of the sample.

Fully embedded and integrated within the SEM software, simply click on the area of interest and the stage will move to that spot. Zoom in and pan around for locating the area of interest with pin point accuracy. No calibration or alignments are required by the user.

Cross hairs on the color image indicate the sample position under the electron beam.

The SNS images can be saved and recalled for navigation at a later date.

SNS is standard on our JSM-IT500HR and JSM-IT500 series SEMs and an option on our JSM-IT200 series SEMs.

Showing 0 Comment

Comments are closed.

Other Resources

The following resources are available concerning Electron Optic related instruments:

  • Image Gallery
    -View a selection of electron images
  • FAQs
    -See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    -View our page of useful and interesting links to various electron microscopy resources
  • Videos
    -View some product presentations of our instruments
  • SEM Theory and SEM Training

Request Technical Documents for JEOL EPMA (Microprobes)

  • 1
  • 2
  • EPMA documents
  • Contact Info
  • Technical Documentation for JEOL EPMA (Microprobes)