Analysis of cyanoacrylate adhesive using the JMS-S3000 “SpiralTOF™” — Application of Kendrick Mass Defect plot analysis
MSTips No. 220
SpiralTOF™ has been used previously for the detailed characterization of polymers and lipids. Due to the high mass- resolution of SpiralTOF™, slight mass difference between CH4 and O (Δ 0.036 Da) can be easily discriminated. However, the analysis of complicated compounds by high mass-resolution MS requires an effective data processing method. Recently, Kendrick mass defect (KMD) plot analysis has been proposed as an effective data processing technique for SpiralTOF™ which allows for the structural characterization of complicated compounds1, 2. Here, a commercial acrylic adhesive containing cyanoacrylate was characterized using a SpiralTOF™ combined with KMD plot analysis.