JEOL USA Press Releases

Program recognizes outstanding IU student research performed on the JEM-NeoARM200CF; multi-year initiative continuing through 2027

Peabody, MA – JEOL USA, Inc announced the winners of the 2025 JEOL–IU NeoARM Research Award, a program recognizing compelling undergraduate and graduate research conducted using the JEOL JEM-NeoARM200CF electron microscope.

First Place: Baixu Zhu

Superstructural phase transitions in polymer-grafted nanooctahedra -
https://www.science.org/doi/10.1126/sciadv.adw2740

Second Place: Megan Knobeloch

Visible light absorbing intergrowths with SrBi₃O₄Cl₃ and Bi₂GdO₄Cl as building blocks for water splitting

Third Place: Rukshanthan Selvaraj

Effect of Nanoparticle-Support Interactions on High Entropy Alloy Nanoparticle Formation

The NeoARM Research Award includes a monetary prize and celebrates research showcased through published papers, research posters, or conference presentations. Submissions were evaluated by an expert panel at JEOL.

About the NeoARM:

Since its introduction, the JEOL ARM (Atomic Resolution Microscope) TEM/STEM line has become the chosen platform for atomic resolution imaging/analytical research. The ARM product line is at the leading edge of research in the spherical aberration corrected class of instruments.

In response to the increased need for high-resolution imaging of materials, containing light elements, and of specimens susceptible to electron-beam damage, JEOL has developed the 200kV NEOARM Atomic Resolution Imaging & Analytical Electron Microscope. The NEOARM is designed with user accessibility in mind; with an intuitive interface and streamline workflow, the NEOARM is an ideal choice not only for experienced researchers but also for graduate students and novice users entering the field of electron microscopy. This ease-of-use allows new users to quickly become proficient and productive, without compromising on the instrument’s advanced capabilities.

The NEOARM excels at atomic-resolution imaging for a wide range of accelerating voltages ranging from 30 kV to 200 kV. The NEOARM features a unique cold field emission gun (Cold-FEG) as well as a next generation advanced Cs corrector (ASCOR) that compensates for higher order aberrations.

Learn more about Indiana University’s programs and facilities:

• IU Department of Chemistry: https://www.chem.indiana.edu/
• IU Electron Microscopy Center: https://iubemcenter.indiana.edu/index.html 

January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger.

These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user for quick easy setup.  Now remote enabled for access and control through a web browser, monitoring and adjusting the milling process is possible from anywhere when connected to a LAN.

Upgraded configurations include air-isolated transfer workflows for reactive specimens, wide area milling (up to 8mm or more), surface milling and sputter coating.

JEOL has been a leader in the field of ion beam specimen preparation with over 2000 units sold since its launch in 2003.  JEOL’s Cross Section Polishers™ are widely used in the fields of electronics/semiconductor, ceramics, metallurgy, battery, polymer and life science.  The CPs produce pristine cross sections of the most challenging specimens: brittle materials, multilayer coatings, fragile-porous materials, polymers and composites etc.  Contact JEOL to learn more about these innovative tools to meet your specimen preparation challenges.

JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System). 

This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the research and development of future electronic and spintronic devices".

Nanoscale electromagnetic field imaging by advanced differential phase-contrast STEM

Congratulations to authors Satoko Toyama, Takehito Seki, Yuji Kohno, Yoshiki O. Murakami, Yuichi Ikuhara and Naoya Shibata! At JEOL USA, we are committed to driving innovation and empowering researchers to achieve groundbreaking discoveries. To learn more about how the MARS can advance your laboratory's research, contact your local sales representative today.

JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen.

This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology.

Recently highlighted in a study by the University of Tokyo and published in Nature Communications, the MARS was instrumental in visualizing space charge layers across grain boundaries in fuel cell solid electrolytes. This discovery underscores the system’s potential to advance research in battery materials and beyond.

Magnetic Field-Free Objective Lens with High-Resolution Imaging

The MARS is equipped with a magnetic field-free objective lens, allowing unparalleled resolution without the influence of strong magnetic fields on specimens. This innovative design integrates two opposing lenses to create a magnetic field-free sample environment, enhancing stability and reducing chromatic aberration. Combined with a higher-order aberration corrector, the system achieves atomic resolution imaging.

Key features include:

Why Choose the JEM-Z200MF?

The MARS represents the height of magnetic field-free electron microscopy. Its high-resolution capabilities and design empower researchers to push the boundaries of discovery with precision and clarity.

Explore how the revolutionary MARS S/TEM can transform your research. Contact JEOL USA to learn more about this groundbreaking instrument.

The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”).

This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM of alternatives to the standard Schottky field emission gun (FEG), such as the cold FEG, owing to their superior coherence.

Despite the known benefits of the cold FEG over thermally assisted FEG, practical limitations prevented its use in cryo-EM until JEOL’s CryoARM microscope series was developed. Cold FEG was initially used on 300 kV cryomicroscopes to push the frontier of attainable resolution, ultimately resulting in cryo-EM reconstructions at “atomic resolution” where individual atoms are visible as separated spheres of density.

Following this success, attempts have been made at using the cold FEG source on 200 kV cryomicroscopes, which are generally smaller and less expensive, to see how far the tighter energy spread would allow the resolution to be pushed on this more accessible instrument.

In this webinar, the speaker will present results from a cold FEG-equipped CryoARM200 microscope that demonstrates how 200 kV data can be used to produce sub-2Å structures for a range of samples. The resolution of the reconstructions is comparable to that obtained from the more expensive state-of-the-art 300 kV microscopes.

All of the results described in the webinar are from data collected in an automated manner using the open-source software SerialEM. The familiarity that many users have with SerialEM, as well as its overall openness and ease-of-use, make obtaining high-quality data on this platform possible even for users who do not have extensive experience using a CryoARM microscope.

Register for this webinar today to gain insights into cryo-electron microscopy and how the integration of cold FEG technology in JEOL’s CryoARM200 microscope is revolutionizing cryo-EM.

Join Alan Merk, Electron Microscopist, Leidos Biomedical Research, for the live webinar on Monday, September 30, 2024, at 2pm EDT (11am PDT).

For more information, or to register for this event, visit Exploring the Range of Electron Microscopes: Resolution, Size and Users.

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The JSM-IT810 series Ultrahigh Resolution FE SEM made its debut at the Microscopy and Microanalysis 2024 conference in late July. This debut included live demonstrations for those in the market for an analytical ultrahigh resolution FE SEM.

This new platform is where versatility meets high spatial resolution and ease-of-use with the next level in JEOL’s intelligent technology for imaging and analysis at the nanoscale. Powerful software with automation built-in, enables seamless acquisition of data from observation to elemental analysis and reporting.

The JEOL NEOENGINE® electron beam control system and advanced auto functions provide fast and clear transitions from high resolution imaging to high current analysis without sacrificing performance. Capabilities include up to 2,000,000X magnification and accelerating voltage range from 0.01 to 30kV making it possible to acquire outstanding detail of nanomaterials or biological nanostructures.

New No-Code automation workflows come standard and make it very easy to achieve high throughput results. It is possible to automate the collection of images and analyses under multiple beam settings, positions and detectors without user intervention. Enhance efficiency and productivity with these new automation routines.

Equip with JEOL’s embedded Live EDS allows for direct monitoring of chemical composition during imaging.

Novel segmented detector options are available for Live 3D surface reconstruction for enhanced viewing of complex surfaces.

To experience the new capabilities or explore solutions that meet your work, customers are invited to contact JEOL USA.

JEOL (President & CEO Izumi Oi) announced the release of the "ROYAL PROBE™ AUTOMAS", a high-throughput solid-state NMR probe for nuclear magnetic resonance (NMR) systems, on 1st July 2024.

The ROYAL PROBE™ AUTOMAS is the successor to the AUTOMAS probe, which was launched in 2018 as a high-throughput solid-state NMR probe.

The AUTOMAS probe, in combination with the NMR software Delta, the Auto Sample Changer (ASC), and the Auto-Tuning Unit, allows multiple samples to be measured in series.

In addition to the basic functions of the AUTOMAS probe, the ROYAL PROBE™ AUTOMAS adds new features such as a seamless tuning range with the slider unit, automatic magic angle adjustment, and an extended measurement temperature range. These improvements dramatically enhance ease of use and make solid-state NMR measurements more accessible.

JEOL Ltd. (President & CEO Izumi Oi) announced the release of High Sensitivity COOL Probe "SuperCOOL MARVEL" for Nuclear Magnetic Resonance, NMR, on July 1st, 2024. Its sales are scheduled to begin in October 2024.

SuperCOOL MARVEL is the fourth generation of the SuperCOOL probe series, which was launched in 2013. The SuperCOOL probe series suppresses thermal noise and enables highly sensitive NMR measurements by cooling the RF coil and preamplifier to liquid nitrogen temperature. This product not only utilizes the low-temperature cooling technology know-how that we have cultivated over many years, but also achieves a significant improvement in sensitivity by completely redesigning the electrical circuitry inside the probe.

SuperCOOL MARVEL, which can measure low noise and high sensitivity, is a multi-nuclear probe capable of measuring not only common nuclei such as 1H and 13C, but also nuclei such as 19F and 31P. It is highly effective in measuring samples that decompose or change quickly, as well as trace samples that are difficult to obtain.

JEOL (President and CEO: Izumi Oi) announces the release of the new electron microscope JEM-120i developed with the concepts of "Compact", "Easy To Use", and "Expandable" on May 30, 2024.

Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the JEM-120i has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users.

Main Features

Compact

The JEM-120i adopts a totally new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third of that of conventional models, enabling effective use of space. The instrument height is lower than 1,800 mm, which fits just about any installation room.

Easy to Use

The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. The JEM-120i provides seamless observations from low to high magnification.

It takes only 4 steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time, and clicking the target field of view will complete the stage movement. Standard "Butler mode" assists data acquisition. Even a beginner can capture data easily.

Expandable

In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count can be selected as an option.

Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time.

The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency.

Main Specifications

*1 (HC) : High contrast configuration
*2 (HR) : High resolution configuration

JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron Microscopy. The new system complements JEOL’s existing Cryo-TEM technology and provides a comprehensive solution for preparing and imaging vitreous frozen biological and biopolymer samples to be observed in the CRYO ARM 200 and CRYO ARM 300II Transmission Electron Microscopes. 

JEOL’s CRYO-FIB-SEM incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for optimum specimen handling. The CRYO-FIB-SEM has a built-in sputter coating function, making it possible to perform conductivity coating, protective film forming, and FIB processing in a single system. 

Additionally, the workflow is based on JEOL's specially-designed CRYO ARM™ cartridge, allowing direct specimen transfer to the CRYO ARM™ after specimen preparation with the CRYO-FIB-SEM. A cryo-CLEM workflow using the CRYO ARM™ cartridge can be constructed using a cryostage manufactured by Linkam Scientific Instruments* and a fluorescence microscope manufactured by Nikon Solutions*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments.

Using Cryo-EM, researchers can capture high resolution details of proteins and biological specimens. With the advent of the resolution revolution for Cryo-EM beginning around 2010, JEOL CRYO ARM TEMs continue to solve structures previously reserved for traditional X-Ray Crystallography. Imaging data achieved at rapid speeds can be used to create 3D reconstructions of viruses and proteins. Data can also be interpreted using Single Particle Analysis, MicroED using electron diffraction from 3D crystals, electron crystallography, and tomography. 

“Along with the CryoARM, the CryoFIB now closes the loop in the cryo-EM process to provide a solution that is completely JEOL. This will streamline the entire cryo-EM process, from sample preparation to data collection,” said JEOL TEM Product Manager Dr. Patrick Phillips. 
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