JEOL USA, Inc.
  • PRODUCTS
      • Transmission Electron Microscopes (TEM)
      • Scanning Electron Microscopes (SEM)
      • Microprobe (EPMA) and Auger
      • Sample Preparation Tools
      • Focused Ion Beam
      • Elemental Analysis
      • Correlative Microscopy Solutions
      • Mass Spectrometers
      • Nuclear Magnetic Resonance
      • Electron Spin Resonance
      • Photomask / Direct Write Lithography
      • Additive Manufacturing
      • Medical Equipment
      • Industrial Equipment
  • APPLICATIONS
      • Additive Manufacturing
      • Batteries
      • Ceramics
      • Chemistry
      • Drug Discovery
      • Energy
      • Environmental
      • Failure Analysis
      • Food / Plant / Pesticides
      • Forensics
      • Geology Solutions
      • Life Sciences
      • Materials Science
      • Nanotechnology
      • Pathology
      • Pharma NMR
      • Plastics/Polymer
      • Semiconductor
      • Application List by Product
      • Yokogushi (Cross-Platform Analysis)
  • RESOURCES
      • Electron Optics
      • Mass Spectrometry
      • Nuclear Magnetic Resonance
      • Photomask / Direct Write Lithography
      • Sample Preparation
      • Additive Manufacturing
      • Webinars and Videos
      • Posters
      • JEOL Periodic Table App
      • JEOL MS Calculator App
      • Scanning Electron Microscopy Basics
      • Transmission Electron Microscopy Basics
      • Mass Spectrometry Basics
      • NMR Basics
      • Financing
  • SERVICE / SUPPORT
      • JEOL USA Service & Support
      • Offered Services
      • Service Level Agreements
      • Environmental Remediation
      • Request Service
      • Parts Center
      • Instrument Training
  • NEWS & EVENTS
      • Blog
      • Press Releases
      • Events and Trade Shows
      • JEOL USA Image Contest
      • JEOL NEWS Magazine
      • JEOL Newsletters
      • REALab Customer Stories
  • ABOUT US
      • The Company
      • Milestones
      • Management Team
      • FAQ
      • Corporate Benefits
      • Current Career Opportunities
      • Submit Application
      • Social Governance Statement
  • CONTACT US
      • Contact Us
      • Find a Local Sales Rep
      • Direction to JEOL USA
      • Request Product Info
      • Find a Local Service Office
      • JEOL Regional Websites
PRODUCTS
  • Scanning Electron Microscopes (SEM)
    • HV/LV Tungsten/LaB6 SEMs
    • JSM-IT210
    • JSM-IT510
    • High-Res, Large-Chamber SEM
    • JSM-IT710HR
    • Benchtop
    • NeoScope Benchtop SEM
    • FE SEM
    • JSM-IT810
    • SEM-FIB
    • Elemental Analysis
    • miXcroscopy™
    • SMILE VIEW™ Map software
    • Neo Comfort FE-SEM Acoustic Enclosure
    • LazEdge Laser SEM system
  • Transmission Electron Microscopes (TEM)
    • 120 kV
    • JEM-120i
    • 200 kV
    • NEOARM
    • Monochromated ARM200F
    • JEM-F200 F2
    • JEM-2100Plus
    • CRYO ARM™ 200
    • JEM-ACE200F
    • JEM-Z200MF
    • 300 kV
    • JEM-ARM300F2
    • CRYO ARM™ 300 II
    • Analytical & Data Optimization
    • JEOL-IDES Products
    • Environmental Control Solutions
    • SightSKY CMOS Camera
    • SiN Window Chip
    • Stack N Viz software
    • XtaLAB Synergy-ED
  • Focused Ion Beam
    • CRYO-FIB-SEM
    • JIB-PS500i
    • Specimen Preparation System STEMPLING
  • Sample Preparation Tools
    • Cross Section Polisher
    • Vacuum Evaporator
    • Smart Coater
    • Carbon Coater
    • UV Cleaner
    • Auto Fine Coater
    • Ion Cleaner
    • Dry Pumping Multi Station
    • HD Treatment
  • Nuclear Magnetic Resonance
    • JNM-ECZL series FT NMR
    • Probes
    • Liquids/Solution State Probes
    • Operando Battery Probe
    • ROYALPROBE
    • ROYALPROBE HFX
    • ROYALPROBE P+
    • SuperCOOL Probe
    • UltraCOOL Probe
    • Solid State NMR Probes
    • AutoMAS Solids Probe
    • HCN MAS and HXY NMR Probes
    • NMR Probe Key Features and Applications
    • Delta NMR Software
    • NMR in pharma
    • qNMR
    • Magnets
    • Sample Changers
    • Cryogen Reclamation System
  • Electron Spin Resonance
    • JES-X320
    • JES-X310
  • Mass Spectrometers
    • AccuTOF DART
    • AccuTOF DART Technology
    • AccuTOF DART Ionization Mechanisms
    • AccuTOF Time-of-Flight Mass Analyzer
    • AccuTOF DART High-Resolution Accurate Mass
    • AccuTOF GC-Alpha
    • msFineAnalysis AI
    • AccuTOF GCxGC MS
    • AccuTOF LC-Express
    • GC/Single-Quadrupole Mass Spectrometer
    • NETZSCH And JEOL
    • msFineAnalysis iQ
    • GC/Triple-Quadrupole Mass Spectrometer
    • msFineAnalysis iQ
    • MALDI-TOFMS
    • NewSpiralTOF™ Matrix-Assisted Laser Desorption/Ionization TOFMS
    • NewSpiralTOF™ Polymer Analysis System
    • NewSpiralTOF™ Mass Spectrometry Imaging System
    • msRepeatFinder Polymer Analysis Software
  • Microprobe (EPMA) and Auger
    • JXA-iHP200F
    • JXA-iSP100
    • JAMP-9510F
    • Soft X-Ray Emission Spectrometers
  • Photomask / Direct Write Lithography
    • Electron Beam Lithography
    • JBX-A9
    • JBX-8100FS
    • JBX-3050MV
    • SB-89010EUVC
  • Elemental Analysis
    • Embedded EDS for SEM
    • Gather-X Windowless EDS
    • Soft X-ray Emission Spectrometer
    • ElementEye JSX-1000S XRF
  • Correlative Microscopy Solutions
  • Additive Manufacturing 3D Printer
  • Medical Equipment
    • BioMajesty Series
    • JCA-6010/C
    • JCA-BM 6050
    • JCA-9130/C
    • JCA-BM 2250
    • JCA-BM 8000 Series
  • Industrial Equipment
    • High-Power Electron Beam Sources
    • Electron Beam Sources
    • BS-60050EBS Electron Beam Source
    • EB Source Power Supply
    • Plasma Source
    • Rotary Sensor
APPLICATIONS
  • Application List
    • Additive Manufacturing
    • Battery Materials
    • Ceramics
    • Chemistry
    • Energy
    • Failure Analysis
    • Food / Plant / Pesticides
    • Food
    • Forensics
    • Geology Solutions
    • Life Sciences
    • Materials Science
    • Nanotechnology
    • Pathology
    • Pesticides
    • Plant
    • Plastics/Polymer
    • Semiconductor
    • SEE MORE HERE
  • Application List By Product
    • SEM Applications
    • TEM Applications
    • NMR Applications
    • FIB Applications
    • Mass Spec Applications
    • Sample Prep Applications
  • REALab Customer Stories
  • Yokogushi (Cross-Platform Analysis)
RESOURCES
  • Electron Optics
    • Documents & Downloads
    • Image Gallery
    • FAQs
    • Links & Resources
    • Videos
    • Scanning Electron Microscopy Basics
  • Analytical Instruments
    • Documents & Downloads
    • Walkup NMR
    • Reference Data
    • Tutorials (Mass Spec)
    • Tutorials (NMR)
    • No-D NMR
    • Non Uniform Sampling (NUS)
    • Mass Spectrometry Basics
    • NMR Basics
    • NMR Magnet Destruction
  • Photomask / Direct Write Lithography
    • Documents & Downloads
  • Sample Preparation
    • Documents & Downloads
    • Image Gallery
  • Additive Manufacturing
  • Webinars and Videos
  • Posters
  • JEOL Periodic Table App
  • JEOL MS Calculator App
  • Financing