Electron Optic Documents

The field of single particle structure analysis (SPA) by cryo-electron microscopy reached new highs with the publication of a 1.19Å structure of apo-ferritin by Maki-Yonekura et al. obtained using a JEOL CRYO ARM™ 300 model 33001. This electron cryo-microscope was specifically designed for highly automated workflows capable of the unattended acquisition thousands of images of vitrified specimens. Workflow support of the JEOL CRYO ARM™ is available for SPA, batch tomography and microED.

Determining the near-atomic resolution structure of a biological macromolecule requires time on a high-end electron cryo-microscope. Depending on the local situation this could mean acquiring images of frozen-hydrated specimens on a JEOL CRYO ARM™ and/or another cryo microscope. To optimize inter-operability between different brands of cryo-microscopes, JEOL have investigated two related aspects: a) the reverse transfer, that is extracting frozen-hydrated specimens from one microscope to be transferred to another one, and b) the usability of a special cartridge designated as AG that are AutoGrid compatible.

JEOL SEMs are delivered with the capability for remote viewing and remote operation. The SEM computer includes a 2nd ethernet card for connection to your local area network. There is no need for a second support computer. Just connect your JEOL SEM computer to a reliable and fast broadband internet connection and choose the software platform that meets your remote access requirements.

JEOL’s large chamber SEMs are designed for easy access in both the Tungsten SEM and Thermal Schottky Field Emission SEM models. Our large, direct-access sample chambers are ideal suited for the labs that require high-throughput and multi-sample imaging and analysis, multiple ports to fit a variety of accessories, and analysis of large samples that cannot be cut to size.

Data set for observing ferromagnetic samples. The mode has no magnetic field around samples.

Our new generation of low vacuum secondary electron detector (LVSED) provides enhanced performance at fast scan speeds and even greater collection efficiency. Why choose LVSED imaging over backscattered electron (BSE)? Considering electron-beam sample interaction, SE imaging can provide better overall spatial resolution as well as the ability to observe fine topographic detail when compared to BSE imaging. This is especially true when imaging low Z materials where interaction volumes can be high with BSE imaging.

Luminary Micro is a Compact Specimen Photoexcitation System (CPXS) for JEOL TEMs. It is composed of a modulated laser, a compact optical delivery system, an inlet port, and a mirror. With this add-on, users can direct and focus the laser output onto the TEM sample in situ. Luminary Micro can induce a rich variety of reactions and dynamic processes in the specimen, thanks to its <40 μm FWHM focus size, adjustable peak power up to 3 W, and the modulated pulse widths ranging from a few microseconds to seconds. With Luminary Micro, users can study laser-induced phenomena in situ using fast cameras. Combined with IDES/JEOL EDM fast shutter and/or Relativity subframing systems, Luminary Micro allows users to perform time-resolved studies using pump-probe methods in the microsecond time scale. The extremely compact footprint of the system allows easy installation without affecting the TEM resolution. The user can heat specimens to thousands of degrees C while keeping the freedom to use the specimen holder of your choice.

The SHL is a newly designed objective lens for high-resolution observation at low accelerating voltages. Unlike the semi-in lens SEM, with a large electromagnetic field below the lens, which was widely used for high-resolution, low kV observation, the SHL achieves high resolution by superimposing a magnetic field onto the electrostatic field to suppress magnetic field leakage. Therefore, the SHL is suitable for the high resolution observation of magnetic materials and electron backscattered diffraction (EBSD) even at short WD, which were difficult with the semi-in lens type SEMs. The SHL type SEM can also be configured for low vacuum operation while the semi-in lens type cannot.

Using Minimal Fringe Illumination and Coma-Free Image Shift an unprecedented throughput is possible on a JEOL CRYO ARM™. Given that a typical structure as published on EMPIAR requires 4-5000 images, the potential therefore exists of solving roughly 4-5 structures per day using a JEOL CRYO ARM™.

STEM-in-SEM (Scanning Transmission Electron Microscopy in an SEM) has become a popular technique for biologists, polymer scientists and materials scientists for its ease of use, cost effectiveness and high resolution. It is especially suited to investigation of the internal structure of thin film (50-100nm) samples as well as size and shape of submicron to nanometer particles. With standard SEM imaging modes and EDS analysis on bulk samples, there are limitations in the ultimate resolution that can be achieved due in part to the beam-sample interactions. With STEM-in-SEM, the sample is very thin and the interaction volume is greatly reduced, which allows for sub-nanometer resolution and nanoscale analysis. One of the main challenges to EDS analysis using STEM-in-SEM is how to reduce the hard X-ray contribution from the detector and chamber (generally peaks from Al and Si). JEOL has designed a dedicated Analytical holder with a carbon retainer that greatly reduces these spurious peaks allowing for more accurate analytical data.